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Optical testing
6
"Optical testing by the use of the chromatic split of non-classical localization planes" (2003) Comastri, S.A.; Simon, J.M.; Echarri, R. 19th Congress of the International Commisssion for Optics Optics for the Quality of Life. 4829 I:172-173
"Wide band interferometry for thickness measurement" (2003) Costantino, S.; Martínez, O.E.; Torga, J.R. Optics Express. 11(8):952-957
"Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes" (2003) Comastri, S.A.; Echarri, R.M.; Simon, J.M. Journal of Optics A: Pure and Applied Optics. 5(3):283-293
"Optical testing by using the chromatic split of non-classical localization planes" (2003) Comastri, S.A.; Simon, J.M.; Echarri, R.M. Journal of Optics A: Pure and Applied Optics. 5(5):S342-S346
"Shifting of localization planes in optical testing: Application to a shearing interferometer" (2001) Simon, J.M.; Comastri, S.A.; Echarri, R.M. Applied Optics. 40(28):4999-5010
"The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting" (2001) Simon, J.M.; Comastri, S.A.; Echarri, R.M. Journal of Optics A: Pure and Applied Optics. 3(4):242-249