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Abstract:

An amplitude-division two-beam interferometer illuminated by a quasi-monochromatic, spatially incoherent, and periodic source yields multiple localization planes of interference fringes. If a thick transmission sample with a few localized phase disturbances in various layers is placed in the interferometer, the disturbances in a layer can be detected, making its images through the two arms coincide with a chosen localization plane. Different layers can be analyzed by means of shifting the localization plane by a variation of the source period without any other changes in the device. Here we illustrate this method by applying it to a shearing interferometer, a classical Wollaston prism placed between crossed polarizers. Experimental images of different observation planes are obtained, and they are in good agreement with the theoretical expectations. © 2001 Optical Society of America.

Registro:

Documento: Artículo
Título:Shifting of localization planes in optical testing: Application to a shearing interferometer
Autor:Simon, J.M.; Comastri, S.A.; Echarri, R.M.
Filiación:Laboratorio de Optica, Facultad de Ciencias Exactas y Naturales, Universidad de Buenos Aires, Buenos Aires, 1428, Argentina
Consejo Nacional de Investigaciones Cientificas y Técnicas, Buenos Aires, Argentina
Palabras clave:Image processing; Interferometers; Light interference; Prisms; Shearing interferometers; Optical testing
Año:2001
Volumen:40
Número:28
Página de inicio:4999
Página de fin:5010
DOI: http://dx.doi.org/10.1364/AO.40.004999
Título revista:Applied Optics
Título revista abreviado:Appl. Opt.
ISSN:1559128X
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_1559128X_v40_n28_p4999_Simon

Referencias:

  • Steel, W.H., (1967) Interferometry, , Cambridge University, London
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  • Comastri, S.A., Simon, J.M., Multilocalization and van Cittert-Zernike theorem. 1. Theory (2000) J. Opt. Soc. Am., 17, pp. 1265-1276
  • Simon, J.M., Comastri, S.A., Multilocalization and van Cittert-Zernike theorem. 2. Application to the Wollaston prism (2000) J. Opt. Soc. Am., 17, pp. 1277-1283
  • Simon, J.M., Comastri, S.A., Echarri, R., The Mach-Zehnder interferometer: Examination of a volume by non classical localization plane shifting (2001) Pure Appl. Opt., 3, pp. 242-249

Citas:

---------- APA ----------
Simon, J.M., Comastri, S.A. & Echarri, R.M. (2001) . Shifting of localization planes in optical testing: Application to a shearing interferometer. Applied Optics, 40(28), 4999-5010.
http://dx.doi.org/10.1364/AO.40.004999
---------- CHICAGO ----------
Simon, J.M., Comastri, S.A., Echarri, R.M. "Shifting of localization planes in optical testing: Application to a shearing interferometer" . Applied Optics 40, no. 28 (2001) : 4999-5010.
http://dx.doi.org/10.1364/AO.40.004999
---------- MLA ----------
Simon, J.M., Comastri, S.A., Echarri, R.M. "Shifting of localization planes in optical testing: Application to a shearing interferometer" . Applied Optics, vol. 40, no. 28, 2001, pp. 4999-5010.
http://dx.doi.org/10.1364/AO.40.004999
---------- VANCOUVER ----------
Simon, J.M., Comastri, S.A., Echarri, R.M. Shifting of localization planes in optical testing: Application to a shearing interferometer. Appl. Opt. 2001;40(28):4999-5010.
http://dx.doi.org/10.1364/AO.40.004999