Abstract:
The Mach-Zehnder interferometer can be used as is customary in optical testing but, to examine different layers of a volume, the procedure of either readjusting the interferometer or displacing the specimen can be avoided, employing an incoherent periodic source. In this case, leaving the specimen in a fixed position and without readjusting the interferometer, the different layers can be analysed, shifting a non-classical localization plane by a change in the source period. In this paper experimental interferograms, obtained by varying this period to map the disturbances present on either one or both faces of a phase object, are shown.
Registro:
Documento: |
Artículo
|
Título: | The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting |
Autor: | Simon, J.M.; Comastri, S.A.; Echarri, R.M. |
Filiación: | Universidad de Buenos Aires, Departamento de Fisica, Ciudad Universitaria, Buenos Aires, Argentina Consejo Nacional de Investigaciones Cientificas y Técnicas, Argentina
|
Palabras clave: | Interferometry; Transparent media exploration; Incoherent periodic source; Localization plane shifting; Mach-Zehnder interferometer; Transparent media exploration; Holographic interferometry; Light polarization; Light reflection; Mirrors; Optical beam splitters; Optical testing; Refraction; Volume measurement; Interferometers |
Año: | 2001
|
Volumen: | 3
|
Número: | 4
|
Página de inicio: | 242
|
Página de fin: | 249
|
DOI: |
http://dx.doi.org/10.1088/1464-4258/3/4/303 |
Título revista: | Journal of Optics A: Pure and Applied Optics
|
Título revista abreviado: | J Opt A Pure Appl Opt
|
ISSN: | 14644258
|
CODEN: | JOAOF
|
Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_14644258_v3_n4_p242_Simon |
Referencias:
- Steel, W.H., (1967) Interferometry, , (London: Cambridge University Press)
- Malacara, D., (1978) Optical Shop Testing, , (New York: Wiley)
- Hariharan, P., Modified Mach-Zehnder interferometer (1969) Appl. Opt., 8, pp. 1925-1926
- Simon, J.M., Iemmi, C.C., Interferometers: Equivalent sine condition and pseudoholographic properties (1990) Appl. Opt., 29, pp. 1868-1869
- Schwider, J., Falkenstrfer, O., Twyman-Green interferometer for testing microspheres (1995) Opt. Eng., 34, pp. 2972-2975
- Simon, J.M., Comastri, S.A., Localization of interference fringes (1980) Am. J. Phys., 48, pp. 665-668
- Simon, J.M., Comastri, S.A., Fringe localization depth (1987) Appl. Opt., 26, pp. 5125-5129
- Simon, J.M., Comastri, S.A., Interferometers: Equivalent sine condition (1988) Appl. Opt., 27, pp. 4725-4730
- Simon, J.M., Simon, M.C., Echarri, R.M., Garea, M.T., Fringe localization in interferometers illuminated by a succession of incoherent line sources (1998) J. Mod. Opt., 45, pp. 2245-2254
- Comastri, S.A., Simon, J.M., Tardin, C., Multilocalization and van Cittert-Zernike theorem 1. Theory (2000) J. Opt. Soc. Am. A, 17, pp. 1265-1276
- Simon, J.M., Comastri, S.A., Tardin, C., Multilocalization and van Cittert-Zernike theorem 2. Application to the Wollaston prism (2000) J. Opt. Soc. Am. A, 17, pp. 1277-1283
- Jahns, J., Lohmann, A.W., The Lau effect (a diffraction experiment with incoherent illumination) (1979) Opt. Commun., 28, pp. 263-267
- Simon, J.M., Comastri, S.A., Echarri, R.M., Shifting of localization planes in optical testing: Application to a shearing interferometer Cuaderno de Optica, 77. , E Ediciones Previas, Lab. de Optica, FCEN-UBA, available from the authors at the address on the title page
- Simon, J.M., Echarri, R.M., Walsh, P.A., Multilocalization of interference fringes in the Mach-Zehnder interferometer (2000) Optik, 111, pp. 307-309
- Malacara, D., Serven, M., Malacara, Z., (1998) Interferogram Analysis for Optical Testing, , (New York: Dekker)
- Dorredo, B.V., Fernandez, J.L., Phase-evaluation methods in whole-field optical measurements techniques (1999) Meas. Sci. Technol., 10, pp. 33-55
Citas:
---------- APA ----------
Simon, J.M., Comastri, S.A. & Echarri, R.M.
(2001)
. The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting. Journal of Optics A: Pure and Applied Optics, 3(4), 242-249.
http://dx.doi.org/10.1088/1464-4258/3/4/303---------- CHICAGO ----------
Simon, J.M., Comastri, S.A., Echarri, R.M.
"The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting"
. Journal of Optics A: Pure and Applied Optics 3, no. 4
(2001) : 242-249.
http://dx.doi.org/10.1088/1464-4258/3/4/303---------- MLA ----------
Simon, J.M., Comastri, S.A., Echarri, R.M.
"The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting"
. Journal of Optics A: Pure and Applied Optics, vol. 3, no. 4, 2001, pp. 242-249.
http://dx.doi.org/10.1088/1464-4258/3/4/303---------- VANCOUVER ----------
Simon, J.M., Comastri, S.A., Echarri, R.M. The Mach-Zehnder interferometer: Examination of a volume by non-classical localization plane shifting. J Opt A Pure Appl Opt. 2001;3(4):242-249.
http://dx.doi.org/10.1088/1464-4258/3/4/303