Abstract:
When a spatially incoherent, periodic, quasi-monochromatic source illuminates a two-beam amplitude division interferometer verifying the equivalent sine condition, successive non-classical localization planes appear. If the radiation is polychromatic, then each plane splits and the plane corresponding to a given wavelength can be viewed distinctly by interposing an adequate filter. Thus, by interchanging filters and with no other change in the configuration, a non-classical localization plane is shifted. In the present paper this shift is employed to examine various transversal planes of a thick transparent specimen with a few phase disturbances distributed in its volume. Results obtained with a Wollaston prism are shown.
Registro:
Documento: |
Artículo
|
Título: | Optical testing by using the chromatic split of non-classical localization planes |
Autor: | Comastri, S.A.; Simon, J.M.; Echarri, R.M. |
Filiación: | Laboratorio de Optica, Department de Física, Pabellón I, (1428) Nuñez, Buenos Aires, Argentina
|
Palabras clave: | Interferometry; Non-classical localization planes; White light; Interferometers; Interferometry; Light sources; Optical filters; Prisms; Non-classical localization planes; Optical testing |
Año: | 2003
|
Volumen: | 5
|
Número: | 5
|
Página de inicio: | S342
|
Página de fin: | S346
|
DOI: |
http://dx.doi.org/10.1088/1464-4258/5/5/389 |
Título revista: | Journal of Optics A: Pure and Applied Optics
|
Título revista abreviado: | J Opt A Pure Appl Opt
|
ISSN: | 14644258
|
CODEN: | JOAOF
|
Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_14644258_v5_n5_pS342_Comastri |
Referencias:
- Malacara, D., Servin, M., Malacara, Z., (1998) Interferogram Analysis for Optical Testing, , New York: Dekker
- Simon, J.M., Comastri, S.A., Localization of interference fringes (1980) Am. J. Phys., 48, pp. 665-668
- Comastri, S.A., Simon, J.M., Two beam interferometers: A classification which takes into account multiple localizations (2001) Optik, 112, pp. 573-587
- Comastri, S.A., Simon, J.M., Tardin, C., Multilocalization and van Cittert-Zernike theorem: 1. Theory (2000) J. Opt. Soc. Am. A, 17, pp. 1265-1276
- Simon, J.M., Comastri, S.A., Echarri, R.M., Shifting of localization planes in optical testing: Application to a shearing interferometer (2001) Appl. Opt., 40, pp. 4999-5010
- Simon, J.M., Comastri, S.A., Two beam interferometer illuminated by a non monochromatic incoherent periodic source: 2. Wollaston prism (2001) Proc. SPIE, 4419, pp. 235-238
- Comastri, S.A., Simon, J.M., Echarri, R.M., Optical testing by the use of the chromatic split of non-classical localization planes (2002) Proc. SPIE, 4829, pp. 197-198
- Steel, W.H., (1967) Interferometry, , Cambridge: Cambridge University Press
Citas:
---------- APA ----------
Comastri, S.A., Simon, J.M. & Echarri, R.M.
(2003)
. Optical testing by using the chromatic split of non-classical localization planes. Journal of Optics A: Pure and Applied Optics, 5(5), S342-S346.
http://dx.doi.org/10.1088/1464-4258/5/5/389---------- CHICAGO ----------
Comastri, S.A., Simon, J.M., Echarri, R.M.
"Optical testing by using the chromatic split of non-classical localization planes"
. Journal of Optics A: Pure and Applied Optics 5, no. 5
(2003) : S342-S346.
http://dx.doi.org/10.1088/1464-4258/5/5/389---------- MLA ----------
Comastri, S.A., Simon, J.M., Echarri, R.M.
"Optical testing by using the chromatic split of non-classical localization planes"
. Journal of Optics A: Pure and Applied Optics, vol. 5, no. 5, 2003, pp. S342-S346.
http://dx.doi.org/10.1088/1464-4258/5/5/389---------- VANCOUVER ----------
Comastri, S.A., Simon, J.M., Echarri, R.M. Optical testing by using the chromatic split of non-classical localization planes. J Opt A Pure Appl Opt. 2003;5(5):S342-S346.
http://dx.doi.org/10.1088/1464-4258/5/5/389