Conferencia
Comastri, S.A.; Simon, J.M.; Echarri, R. "Optical testing by the use of the chromatic split of non-classical localization planes" (2003) 19th Congress of the International Commisssion for Optics Optics for the Quality of Life. 4829 I:172-173
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Abstract:
When a spatially incoherent, periodic, quasi-monochromatic source illuminates an amplitude division two beam interferometer verifying the equivalent sine condition, successive non-classical localization planes appear. If the radiation is polichromatic each plane splits and that corresponding to a given wavelength can be distinctly viewed interposing an adequate filter. Thus interchanging filters and with no other change in the configuration, a non-classical localization plane shifts. In the present paper this shift is employed to examine various transversal planes of a thick transparent specimen with a few phase disturbances distributed in its volume. Results obtained with a Wollaston prism are shown.
Registro:
| Documento: | Conferencia |
| Título: | Optical testing by the use of the chromatic split of non-classical localization planes |
| Autor: | Comastri, S.A.; Simon, J.M.; Echarri, R. |
| Ciudad: | Firenze |
| Filiación: | Laboratorio de Optica, Dep. Física, Ciudad Univ. Pabellón I, (1428) Buenos Aires, Argentina |
| Palabras clave: | Bandwidth; Bifurcation (mathematics); Coherent light; Interferometers; Microscopic examination; Optical fibers; Optical filters; Perturbation techniques; Prisms; Chromatic splits; Fringe spacings; Interferential filters; Localization planes; Optical testing |
| Año: | 2003 |
| Volumen: | 4829 I |
| Página de inicio: | 172 |
| Página de fin: | 173 |
| DOI: | http://dx.doi.org/10.1117/12.524169 |
| Título revista: | 19th Congress of the International Commisssion for Optics Optics for the Quality of Life |
| Título revista abreviado: | Proc SPIE Int Soc Opt Eng |
| ISSN: | 0277786X |
| CODEN: | PSISD |
| Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0277786X_v4829I_n_p172_Comastri |
Referencias:
- Simon, J.M., Comastri, S.A., Echarri, R., (2001) Appl. Opt., 40, pp. 4999-5010
- Comastri, S.A., Simon, J.M., (2001) Proceedings of Spie, 4419, pp. 235-238A4 - ICO-International Commission for Optics; CNR-COnsiglio Nazionale delle Ricerche (Italy); INOA-Instituto Nazional de Ottica Applicata (Italy); SPIE; Universita degli Studi di Firenze (ITALY)
Citas:
---------- APA ----------
Comastri, S.A., Simon, J.M. & Echarri, R. (2003) . Optical testing by the use of the chromatic split of non-classical localization planes. 19th Congress of the International Commisssion for Optics Optics for the Quality of Life, 4829 I, 172-173.http://dx.doi.org/10.1117/12.524169
---------- CHICAGO ----------
Comastri, S.A., Simon, J.M., Echarri, R. "Optical testing by the use of the chromatic split of non-classical localization planes" . 19th Congress of the International Commisssion for Optics Optics for the Quality of Life 4829 I (2003) : 172-173.http://dx.doi.org/10.1117/12.524169
---------- MLA ----------
Comastri, S.A., Simon, J.M., Echarri, R. "Optical testing by the use of the chromatic split of non-classical localization planes" . 19th Congress of the International Commisssion for Optics Optics for the Quality of Life, vol. 4829 I, 2003, pp. 172-173.http://dx.doi.org/10.1117/12.524169
---------- VANCOUVER ----------
Comastri, S.A., Simon, J.M., Echarri, R. Optical testing by the use of the chromatic split of non-classical localization planes. Proc SPIE Int Soc Opt Eng. 2003;4829 I:172-173.http://dx.doi.org/10.1117/12.524169
