Artículo
Comastri, S.A.; Echarri, R.M.; Simon, J.M. "Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes" (2003) Journal of Optics A: Pure and Applied Optics. 5(3):283-293
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Abstract:
A two-beam amplitude division interferometer with negligible equivalent aberrations, verifying the equivalent sine condition and illuminated by an incoherent extended periodic source yields various non-classical localization planes. The source period can be chosen so that a non-classical localization plane coincides with the plane where the images of one of the layers of a thick transparent sample are located thus detecting the perturbations present on this layer and blurring defects corresponding to other layers. In the present paper the process of focalizing different layers and making them coincide with nonclassical localization planes is digitally synthesized starting from a videofilm taken on one observation plane as a point source moves. Images acquired using a Wollaston prism as an interferometer are shown.
Registro:
| Documento: | Artículo |
| Título: | Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes |
| Autor: | Comastri, S.A.; Echarri, R.M.; Simon, J.M. |
| Filiación: | Universidad de Buenos Aires, Facultad Ciencias Exactas Naturales, Laboratorio de Optica, Ciudad Universitaria, Pabellon I, 1428 Nuñez, Buenos Aires, Argentina |
| Palabras clave: | Digital discrimination; Interferometry; Non-classical localization planes; Aberrations; Birefringence; Cameras; Charge coupled devices; Interferometers; Interferometry; Optical films; Optical systems; Perturbation techniques; Prisms; Digital discrimination; Multilocalized fringes; Non-classical localization planes; Two-beam amplitude division interferometer; Videofilm; Optical testing |
| Año: | 2003 |
| Volumen: | 5 |
| Número: | 3 |
| Página de inicio: | 283 |
| Página de fin: | 293 |
| DOI: | http://dx.doi.org/10.1088/1464-4258/5/3/323 |
| Título revista: | Journal of Optics A: Pure and Applied Optics |
| Título revista abreviado: | J Opt A Pure Appl Opt |
| ISSN: | 14644258 |
| CODEN: | JOAOF |
| Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_14644258_v5_n3_p283_Comastri |
Referencias:
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Citas:
---------- APA ----------
Comastri, S.A., Echarri, R.M. & Simon, J.M. (2003) . Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes. Journal of Optics A: Pure and Applied Optics, 5(3), 283-293.http://dx.doi.org/10.1088/1464-4258/5/3/323
---------- CHICAGO ----------
Comastri, S.A., Echarri, R.M., Simon, J.M. "Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes" . Journal of Optics A: Pure and Applied Optics 5, no. 3 (2003) : 283-293.http://dx.doi.org/10.1088/1464-4258/5/3/323
---------- MLA ----------
Comastri, S.A., Echarri, R.M., Simon, J.M. "Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes" . Journal of Optics A: Pure and Applied Optics, vol. 5, no. 3, 2003, pp. 283-293.http://dx.doi.org/10.1088/1464-4258/5/3/323
---------- VANCOUVER ----------
Comastri, S.A., Echarri, R.M., Simon, J.M. Optical testing of perturbations on successive layers: Digital discrimination and multilocalized fringes. J Opt A Pure Appl Opt. 2003;5(3):283-293.http://dx.doi.org/10.1088/1464-4258/5/3/323
