"Comparative analysis of MIS capacitance structures with high-k dielectrics under gamma, 16O and p Radiation" (2012) Quinteros, C.P.;Salomone, L.S.;Redin, E. (...)Campabadal, F. IEEE Transactions on Nuclear Science. 59(4 PART 1):767-772

"Comparative analysis of MIS capacitive structures with high-K dielectrics under gamma, 16O and p radiation" (2011) Quinteros, C.;Sambuco Salomone, L.;Redín, E. (...)Campabadal, F. 12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011:67-72

"Radiation effects on high-k dielectrics. Measurement technique and first results" (2010) Salomone, L.S.;Kasulin, A.;Inza, M.G. (...)Faigón, A. 4th Argentine School of Micro-Nanoelectronics, Technology and Applications and 1st Uruguay School of Micro-Nanoelectronics, Technology and Applications, EAMTA 2010:66-70