Conferencia

Quinteros, C.; Sambuco Salomone, L.; Redín, E.; Rafí, J.M.; Zabala, M.; Faigón, A.; Palumbo, F.; Campabadal, F. "Comparative analysis of MIS capacitive structures with high-K dielectrics under gamma, 16O and p radiation" (2011) 12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011:67-72
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Abstract:

MIS capacitive structures were studied under gamma, 16O and p radiation. The effects observed were registered employing C-V curves. Those showed different characteristics depending on the type of radiation and dielectric. © 2011 IEEE.

Registro:

Documento: Conferencia
Título:Comparative analysis of MIS capacitive structures with high-K dielectrics under gamma, 16O and p radiation
Autor:Quinteros, C.; Sambuco Salomone, L.; Redín, E.; Rafí, J.M.; Zabala, M.; Faigón, A.; Palumbo, F.; Campabadal, F.
Ciudad:Sevilla
Filiación:Consejo Nacional de Investigaciones Científicas Y Técnicas (CONICET), Comisión de Energía Atómica (CNEA), Gral. Paz 1499, San Martín (1650), Argentina
Device Physics Laboratory-Microelectronics, Departamento de Física, Universidad de Buenos Aires, Av. Paseo Colón 850, C1063ACV, Buenos Aires, Argentina
Instituto de Microelectrónica de Barcelona, Centro Nacional de Microelectrónica, Consejo Superior de Investigaciones Científicas (CSIC), Spain
CONICET, Spain
Palabras clave:High-K gate dielectrics; MOS devices; Radiation Effects; C-V curve; Capacitive structure; Comparative analysis; High-k dielectric; High-k gate dielectrics; Dielectric materials; MOS devices; Radiation effects
Año:2011
Página de inicio:67
Página de fin:72
DOI: http://dx.doi.org/10.1109/RADECS.2011.6131387
Título revista:12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011
Título revista abreviado:Eur Conf Rad Effects Compon Syst
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_97814577_v_n_p67_Quinteros

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Citas:

---------- APA ----------
Quinteros, C., Sambuco Salomone, L., Redín, E., Rafí, J.M., Zabala, M., Faigón, A., Palumbo, F.,..., Campabadal, F. (2011) . Comparative analysis of MIS capacitive structures with high-K dielectrics under gamma, 16O and p radiation. 12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011, 67-72.
http://dx.doi.org/10.1109/RADECS.2011.6131387
---------- CHICAGO ----------
Quinteros, C., Sambuco Salomone, L., Redín, E., Rafí, J.M., Zabala, M., Faigón, A., et al. "Comparative analysis of MIS capacitive structures with high-K dielectrics under gamma, 16O and p radiation" . 12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 (2011) : 67-72.
http://dx.doi.org/10.1109/RADECS.2011.6131387
---------- MLA ----------
Quinteros, C., Sambuco Salomone, L., Redín, E., Rafí, J.M., Zabala, M., Faigón, A., et al. "Comparative analysis of MIS capacitive structures with high-K dielectrics under gamma, 16O and p radiation" . 12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011, 2011, pp. 67-72.
http://dx.doi.org/10.1109/RADECS.2011.6131387
---------- VANCOUVER ----------
Quinteros, C., Sambuco Salomone, L., Redín, E., Rafí, J.M., Zabala, M., Faigón, A., et al. Comparative analysis of MIS capacitive structures with high-K dielectrics under gamma, 16O and p radiation. Eur Conf Rad Effects Compon Syst. 2011:67-72.
http://dx.doi.org/10.1109/RADECS.2011.6131387