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Simon, Juan Miguel
37
Applied Optics
17
"Diffraction in the zonal foucalt test" (1977) Simon, J.M. Applied Optics. 16(7):1782-1783
"Testing of flat optical surfaces by the quantitative Foucault method" (1978) Simon, M.C.; Simon, J.M. Applied Optics. 17(1):132-137
"Wollaston prism as a beam splitter in convergent light" (1978) Simon, J.M.; Simon, M.C. Applied Optics. 17(21):3352-3353
"Testing optical surfaces by the method of the caustic using a phase-stripe as spatial filter" (1979) Simon, M.C.; Simon, J.M.; de Zenobi, E.L. Applied Optics. 18(9):1463-1469
"Coma compensation in a parabolized Ebert monochromator" (1979) Gil, M.A.; Simon, J.M. Applied Optics. 18(13):2280-2285
"Sine condition derivation via Fourier optics" (1979) Simon, J.M.; Ratto, J.O.; Comastri, S.A. Applied Optics. 18(17):2912-2913
"Anamorphic cameras for stellar spectrographs" (1980) Simon, J.M.; Simon, M.C. Applied Optics. 19(1):61-65
"New plane grating monochromator with off-axis parabolical mirrors" (1983) Gil, M.A.; Simon, J.M. Applied Optics. 22(1):152-158
"Diffraction gratings: A demonstration of phase behavior in wood anomalies" (1984) Simon, J.M.; Simon, M.C. Applied Optics. 23(7):970
"Diffraction gratings and optical aberrations" (1984) Simon, J.M.; Gil, M.A. Applied Optics. 23(7):1075-1078
"Diffraction grating and optical aberrations: A new and exact formulation" (1985) Gil, M.A.; Simon, J.M. Applied Optics. 24(18):2956-2958
"Synthesis of asymmetric profiies from a doubie grating interferometer" (1986) Lemmi, C.C.; Simon, J.M.; Ratio, J.O. Applied Optics. 25(18):3171-3178
"Phase behavior in wood anomalies" (1986) Simon, J.M.; Simon, M.C.; Garea, M.T. Applied Optics. 25(12):1872-1873
"Czerny-turner monochromator: Astigmatism in the classical and in the crossed beam dispositions" (1986) Simon, J.M.; Gil, M.A.; Fantino, A.N. Applied Optics. 25(20):3715-3720
"Czerny-Turner spectrograph with a wide spectral range" (1988) Simon, J.M.; Gil, M.A.; Fantino, A.N. Applied Optics. 27(19):4069-4072
"Use of the plate diagram in the fast evaluation of monochromators and spectrographs" (1988) Simon, J.M.; Gil, M.A.; Fantino, A.N. Applied Optics. 27(19):4062-4068
"Shifting of localization planes in optical testing: Application to a shearing interferometer" (2001) Simon, J.M.; Comastri, S.A.; Echarri, R.M. Applied Optics. 40(28):4999-5010