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Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009
3
2009
3
"Temperature effects on metal oxide semiconductor dosimeters during switched bias irradiation" (2009) Lipovetzky, J.;Redin, E.;Inza, M.G. (...)Faigón, A. Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009:41-45
"Stand alone MOS dosimetry system for high dose ionizing radiation" (2009) Inza, M.G.;Lipovetzky, J.;Redin, E. (...)Faigon, A. Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009:27-30
"Ring oscillators response to irradiation and application to dosimetry" (2009) Carbonetto, S.;Lipovetzky, J.;Inza, M.G. (...)Faigón, A. Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009:1-4