Conferencia

Carbonetto, S.; Lipovetzky, J.; Inza, M.G.; Redin, E.; Faigón, A. "Ring oscillators response to irradiation and application to dosimetry" (2009) Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009:1-4
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Abstract:

The response of ring oscillators to ionizing irradiation is investigated, regarding their possible use as dosimeters. Different structures were designed, fabricated and tested. Results show that dose resolution can be improved by one order of magnitude compared to conventional MOS dosimeters built in the same process.

Registro:

Documento: Conferencia
Título:Ring oscillators response to irradiation and application to dosimetry
Autor:Carbonetto, S.; Lipovetzky, J.; Inza, M.G.; Redin, E.; Faigón, A.
Ciudad:Bariloche
Filiación:Device Physics Laboratory-Microelectronics, Departamento de Física, Universidad de Buenos Aires, Av. Paseo Colón 850, Buenos Aires, C1063ACV, Argentina
Palabras clave:Dosimetry; Ionizing radiation; MOS devices; Ring oscillator; Different structure; Ionizing irradiation; Mos dosimeter; Order of magnitude; Ring oscillator; Dosimeters; Dosimetry; Ionizing radiation; Irradiation; MOS devices; Nanoelectronics; Optical devices; Radiation shielding; Radioactivity; Oscillators (electronic)
Año:2009
Página de inicio:1
Página de fin:4
DOI: http://dx.doi.org/10.1109/EAMTA.2009.5288910
Título revista:Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009
Título revista abreviado:Proc. Argent. Sch. Micro-Nanoelectronics, Technol. Appl., EAMTA
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_97814244_v_n_p1_Carbonetto

Referencias:

  • Oldham, T.R., Ionizing Radiation Effects in MOS Oxides (1999) Advances in Solid State Electronics and Technology Series, , Singapore: World Scientific
  • Holmes-Siedle, A., Adams, L., RADFETs: A Review of the Use of Metal-Oxide-Silicon Devices as Integrating Dosimeters Radiation Physics and Chemistry, 28 (2), pp. 235-244
  • Oldham, T.R., McLean, F.B., Total Ionizing Effects in MOS oxides and Devices (2003) IEEE Trans. Nucl. Sci, 50 (3), pp. 483-499
  • Hughes, H.L., Benedetto, J.M., Radiation Effects and hardening of MOS Technology: Devices and Circuits (2003) IEEE Trans. Nucl. Sci, 50 (3), pp. 500-520
  • Rabaey, J.M., Chandrakasan, A., Nikolic, B., (2003) Digital Integrated Circuits, , Second edition, Prentice-Hall ISBN 1-13-090996- 3
  • Poch, W.J., Holmes-Siedle, A.G., Long-Term Effects Of Radiation On Complementary Mos Logic Networks (1970) IEEE Trans. Nucl. Sci, NS-17 (6), pp. 33-40
  • Lee, D.-S., Chan, C.-Y., Oxide charge accumulation in metal oxide semiconductor devices during irradiation (1991) J. Appl. Phys, 69 (10), pp. 7134-7141. , May
  • Shaneyfelt, M.R., Swank, J.R., Fleetwood, D.M., Field Dependence of interface trap buildup in polysilicon and metal gate MOS devices (1990) IEEE Trans. Nucl. Sci, 37 (6), pp. 1632-1639. , Dec
  • Vincent R. von Kaenel A High-Speed, low power clock generator for a microprocessor application, IEEE Journal of Solid-Sate Circuits, 33 No. 11, pp. 1634-1639, Nov. 1998; Young, I.A., Greason, J.K., Wong, K.L., A PLL clock generator with 5to 110 MHz of clock range microprocessors (1992) IEEE Journal of Solid-Sate Circuits, 27 (11), pp. 1599-1607. , November
  • Hajimiri, A., Limotyrakis, S., Lee, T.H., Jitter and Phase Noise in Ring Oscillators (1999) IEEE Journal of Solid-Sate Circuits, 34 (6), p. 790. , JuneA4 - IEEE; CAS; UCC; INTI; INVAP

Citas:

---------- APA ----------
Carbonetto, S., Lipovetzky, J., Inza, M.G., Redin, E. & Faigón, A. (2009) . Ring oscillators response to irradiation and application to dosimetry. Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009, 1-4.
http://dx.doi.org/10.1109/EAMTA.2009.5288910
---------- CHICAGO ----------
Carbonetto, S., Lipovetzky, J., Inza, M.G., Redin, E., Faigón, A. "Ring oscillators response to irradiation and application to dosimetry" . Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009 (2009) : 1-4.
http://dx.doi.org/10.1109/EAMTA.2009.5288910
---------- MLA ----------
Carbonetto, S., Lipovetzky, J., Inza, M.G., Redin, E., Faigón, A. "Ring oscillators response to irradiation and application to dosimetry" . Argentine School of Micro-Nanoelectronics, Technology and Applications 2009, EAMTA 2009, 2009, pp. 1-4.
http://dx.doi.org/10.1109/EAMTA.2009.5288910
---------- VANCOUVER ----------
Carbonetto, S., Lipovetzky, J., Inza, M.G., Redin, E., Faigón, A. Ring oscillators response to irradiation and application to dosimetry. Proc. Argent. Sch. Micro-Nanoelectronics, Technol. Appl., EAMTA. 2009:1-4.
http://dx.doi.org/10.1109/EAMTA.2009.5288910