Laser-assisted scanning tunneling microscopy (STM) has been used in recent years to obtain new information about surfaces properties in atomic scale. The authors have performed an experiment using a tungsten tip and highly oriented pyrolytic graphite (HOPG) as the sample. The tip-sample interface was illuminated with an He-Ne laser polarized in the s and p directions. To discriminate laser-induced signal from the background tunneling current, lock-in detection was used.
Documento: | Artículo |
Título: | Assisted scanning tunneling microscopy with visible polarized laser light |
Autor: | Bragas, A.V.; Landi, S.M.; Coy, J.A.; Martinez, O.E. |
Ciudad: | Piscataway, NJ, United States; Anaheim, CA, USA |
Filiación: | Ciudad Universitaria, Buenos Aires, Argentina |
Palabras clave: | Current voltage characteristics; Electric breakdown; Electric fields; Electron tunneling; Frequency modulation; Graphite; Helium neon lasers; Laser beam effects; Light polarization; Photons; Surface properties; Tungsten; Atomic resolution; Current rectification; Electron photon interaction; Highly oriented pyrolytic graphite; Laser induced signal; Photothermal current; Rectification signal; Tunneling current; Scanning tunneling microscopy |
Año: | 1996 |
Volumen: | 9 |
Página de inicio: | 51 |
Página de fin: | 52 |
Título revista: | Proceedings of the 1996 6th Quantum Electronics and Laser Science Conference, QELS |
Título revista abreviado: | Conf Quant Electron Laser Sci QELS Tech Dig Ser |
CODEN: | 00209 |
Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_NIS18908_v9_n_p51_Bragas |