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Abstract:

We present a theoretical analysis of the lateral displacement (Goos-Hänchen shift) of spatially limited beams reflected from attenuated total reflection (ATR) devices in the Otto configuration when backward surface plasmon polaritons are excited at the interface between a positive refractive index slab and a semi-infinite metamaterial with a negative refractive index. First, the stationary phase approximation and a phenomenological model based on the properties of the complex poles and zeroes of the reflection coefficient are used to demonstrate that: (i) the excitation of backward surface waves can lead to both negative and positive (and not exclusively negative) Goos-Hänchen shifts, and (ii) the sign of the shift depends on whether the value of the coupling layer thickness is higher or lower than a critical value characteristic of the ATR structure. Then, these findings are verified through rigorous calculations of the spatial structure of the reflected beam. For incident beams with a Gaussian profile, the lateral shift calculated as the first moment of the field distribution of the reflected beam agrees quite well with the predictions of approximate analysis. Near the resonant excitation of the backward surface plasmon polariton, large (negative or positive) Goos-Hänchen shifts are obtained, along with a splitting of the reflected beam. © 2015 IOP Publishing Ltd.

Registro:

Documento: Artículo
Título:Critical coupling layer thickness for positive or negative Goos-Hänchen shifts near the excitation of backward surface polaritons in Otto-ATR systems
Autor:Zeller, M.A.; Cuevas, M.; Depine, R.A.
Filiación:Departamento de Física, Universidad de Buenos Aires, IFIBA, Ciudad Universitaria, Pabellón I, Buenos Aires, C1428EHA, Argentina
Palabras clave:Attenuated total reflection; Backward waves; Lateral shift; Limited beams; Metamaterials; Surface plasmons; Electromagnetic wave polarization; Electromagnetic wave reflection; Excited states; Metamaterials; Particle optics; Phonons; Photons; Plasmons; Quantum theory; Refractive index; Surface plasmon resonance; Surface waves; Attenuated total reflections; Backward waves; Lateral shifts; Limited beams; Surface plasmons; Gaussian beams
Año:2015
Volumen:17
Número:5
Página de inicio:1
Página de fin:8
DOI: http://dx.doi.org/10.1088/2040-8978/17/5/055102
Título revista:Journal of Optics (United Kingdom)
Título revista abreviado:J. Opt.
ISSN:20408978
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_20408978_v17_n5_p1_Zeller

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Citas:

---------- APA ----------
Zeller, M.A., Cuevas, M. & Depine, R.A. (2015) . Critical coupling layer thickness for positive or negative Goos-Hänchen shifts near the excitation of backward surface polaritons in Otto-ATR systems. Journal of Optics (United Kingdom), 17(5), 1-8.
http://dx.doi.org/10.1088/2040-8978/17/5/055102
---------- CHICAGO ----------
Zeller, M.A., Cuevas, M., Depine, R.A. "Critical coupling layer thickness for positive or negative Goos-Hänchen shifts near the excitation of backward surface polaritons in Otto-ATR systems" . Journal of Optics (United Kingdom) 17, no. 5 (2015) : 1-8.
http://dx.doi.org/10.1088/2040-8978/17/5/055102
---------- MLA ----------
Zeller, M.A., Cuevas, M., Depine, R.A. "Critical coupling layer thickness for positive or negative Goos-Hänchen shifts near the excitation of backward surface polaritons in Otto-ATR systems" . Journal of Optics (United Kingdom), vol. 17, no. 5, 2015, pp. 1-8.
http://dx.doi.org/10.1088/2040-8978/17/5/055102
---------- VANCOUVER ----------
Zeller, M.A., Cuevas, M., Depine, R.A. Critical coupling layer thickness for positive or negative Goos-Hänchen shifts near the excitation of backward surface polaritons in Otto-ATR systems. J. Opt. 2015;17(5):1-8.
http://dx.doi.org/10.1088/2040-8978/17/5/055102