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Abstract:

In this paper, we numerically demonstrate a refraction index sensor based on phase resonance excitation in a subwavelength-slit structure with a double period. The sensor consists of a metal layer with subwavelength slots arranged in a bi-periodic form, separated from a high refraction index medium. Between the metallic structure and the incident medium, a dielectric waveguide is formed whose refraction index is going to be determined. Variations in the refraction index of the waveguide are detected as shifts in the peaks of transmitted intensity originated by resonant modes supported by the compound metallic structure. At normal incidence, the spectral position of these resonant peaks exhibits a linear or a quadratic dependence with the refraction index, which permits us to obtain the unknown refraction index value with a high precision for a wide range of wavelengths. Since the operating principle of the sensor is due to the morphological resonances of the slits' structure, this device can be scaled to operate in different wavelength ranges while keeping similar characteristics. © 2016 Optical Society of America.

Registro:

Documento: Artículo
Título:Refraction index sensor based on phase resonances in a subwavelength structure with double period
Autor:Skigin, D.C.; Lester, M.
Filiación:Universidad de Buenos Aires, Facultad de Ciencias Exactas y Naturales, Departamento de Física, Grupo de Electromagnetismo Aplicado, Buenos Aires, Argentina
Universidad de Buenos Aires, Consejo Nacional de Investigaciones Científicas y Técnicas, Instituto de Física de Buenos Aires (IFIBA), Facultad de Ciencias Exactas y Naturales, Buenos Aires, Argentina
Instituto de Física Arroyo Seco, IFAS (UNCPBA), CIFICEN (UNCPBA-CICPBA-CONICET), Grupo Óptica de Sólidos-Elfo, Pinto 399, Tandil, 7000, Argentina
Palabras clave:Resonance; Waveguides; Metallic structures; Operating principles; Quadratic dependence; Spectral position; Sub-wavelength structures; Subwavelength slits; Transmitted intensities; Wavelength ranges; Refraction
Año:2016
Volumen:55
Número:28
Página de inicio:8131
Página de fin:8137
DOI: http://dx.doi.org/10.1364/AO.55.008131
Título revista:Applied Optics
Título revista abreviado:Appl. Opt.
ISSN:1559128X
CODEN:APOPA
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_1559128X_v55_n28_p8131_Skigin

Referencias:

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Citas:

---------- APA ----------
Skigin, D.C. & Lester, M. (2016) . Refraction index sensor based on phase resonances in a subwavelength structure with double period. Applied Optics, 55(28), 8131-8137.
http://dx.doi.org/10.1364/AO.55.008131
---------- CHICAGO ----------
Skigin, D.C., Lester, M. "Refraction index sensor based on phase resonances in a subwavelength structure with double period" . Applied Optics 55, no. 28 (2016) : 8131-8137.
http://dx.doi.org/10.1364/AO.55.008131
---------- MLA ----------
Skigin, D.C., Lester, M. "Refraction index sensor based on phase resonances in a subwavelength structure with double period" . Applied Optics, vol. 55, no. 28, 2016, pp. 8131-8137.
http://dx.doi.org/10.1364/AO.55.008131
---------- VANCOUVER ----------
Skigin, D.C., Lester, M. Refraction index sensor based on phase resonances in a subwavelength structure with double period. Appl. Opt. 2016;55(28):8131-8137.
http://dx.doi.org/10.1364/AO.55.008131