Abstract:
When a translucent diffuser is illuminated by a speckle pattern, a new speckle pattern is produced. We show that the decorrelation of this intensity pattern by displacement of the diffusing surface is related to the standard deviation of the slope's distribution when the illuminating speckle grain is chosen appropriately small. The experimental results are compared with those obtained by measuring the angular distribution of the mean scattered intensity, and they show good agreement with each other. © 2004 Optical Society of America.
Registro:
Documento: |
Artículo
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Título: | Surface characterization from doubly scattered light |
Autor: | Perez-Quintián, F.; Rebollo, M.A. |
Filiación: | Lab. de Aplicaciones Ópticas, Departamento de Física, Universidad de Buenos Aires, Paseo Colón 850, C1063ACU Buenos Aires, Argentina
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Palabras clave: | Electromagnetic waves; Optical correlation; Refractive index; Speckle; Surface treatment; Theorem proving; Speckle patterns; Surface characterization; Translucent diffusers; Light scattering |
Año: | 2004
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Volumen: | 43
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Número: | 14
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Página de inicio: | 2884
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Página de fin: | 2887
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DOI: |
http://dx.doi.org/10.1364/AO.43.002884 |
Título revista: | Applied Optics
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Título revista abreviado: | Appl. Opt.
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ISSN: | 1559128X
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CODEN: | APOPA
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Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_1559128X_v43_n14_p2884_PerezQuintian |
Referencias:
- Erf, R., (1977) Speckle Metrology, , Academic, New York
- Sirohi, R., (1993) Speckle Metrology, , Marcel Dekker, New York
- Tribillon, G., Correlation entre deux speckles obtenus avec deux longueurs d'onde: Application à la mesure de la rugosité moyenne (1974) Opt. Commun., 11, pp. 172-174
- Léger, D., Mathieu, E., Perrin, J.C., Optical surface roughness determination using speckle correlation technique (1975) Appl. Opt., 14, pp. 872-877
- Perez Quintián, F., Rebollo, M.A., Hogert, E.N., Landau, M.R., Gaggioli, N.G., Relationship between speckle correlation and refraction index variations (1996) Opt. Eng., 35, pp. 1175-1178
- Eliasson, B., Mottier, F., Determination of granular radiance distribution of a diffuser and its use for vibration analysis (1971) J. Opt. Soc. Am., 61, pp. 559-565
- May, M., Françon, M., Correlation and information processing using speckles (1976) J. Opt. Soc. Am., 66, pp. 1275-1281
- Yoshimura, T., Kato, K., Nakagawa, K., Surface-roughness dependence of the intensity correlation function under speckle pattern illumination (1990) J. Opt. Soc. Am. A, 7, pp. 2254-2259
- Beckmann, P., Spizzichino, A., (1963) The Scattering of Electromagnetic Waves from Rough Surfaces, , Pergamon, London
- Perez-Quintián, F., Rebollo, M.A., Gaggioli, N.G., Diffusion of light transmitted from rough surfaces (1997) J. Mod. Opt., 44, pp. 447-460
- Goodman, J.W., Statistical properties of laser speckle patterns (1984) Topics in Applied Physics, 9, p. 36. , Laser Speckle and Related Phenomena, J. C. Dainty, ed., (Springer-Verlag, Berlin)
Citas:
---------- APA ----------
Perez-Quintián, F. & Rebollo, M.A.
(2004)
. Surface characterization from doubly scattered light. Applied Optics, 43(14), 2884-2887.
http://dx.doi.org/10.1364/AO.43.002884---------- CHICAGO ----------
Perez-Quintián, F., Rebollo, M.A.
"Surface characterization from doubly scattered light"
. Applied Optics 43, no. 14
(2004) : 2884-2887.
http://dx.doi.org/10.1364/AO.43.002884---------- MLA ----------
Perez-Quintián, F., Rebollo, M.A.
"Surface characterization from doubly scattered light"
. Applied Optics, vol. 43, no. 14, 2004, pp. 2884-2887.
http://dx.doi.org/10.1364/AO.43.002884---------- VANCOUVER ----------
Perez-Quintián, F., Rebollo, M.A. Surface characterization from doubly scattered light. Appl. Opt. 2004;43(14):2884-2887.
http://dx.doi.org/10.1364/AO.43.002884