Abstract:
We have studied long time relaxation effects on the nonvolatile resistance state produced by resistive switching in devices composed by ceramic YBa 2Cu 3O 7-δ and La 0.7Sr 0.3MnO 3/metal (Au, Pt, Ag) interfaces. The time relaxation can be described by a stretched exponential law that is characterized by a power exponent (n) close to 1/2. We found that the characteristic time (τ) increases with increasing temperature and applied power. The origin of the relaxation effect can be related to oxygen diffusion processes, which were recently associated with the mechanism of bipolar switching in complex oxide interfaces. We argue that the anomalous behavior can be understood in terms of diffusion of oxygen ions (or oxygen vacancies) on a two-dimensional surface with a temperature-dependent density of trapping centers, which may correspond, physically, to the diffusion along grain boundaries. © 2012 American Physical Society.
Registro:
Documento: |
Artículo
|
Título: | Anomalous time relaxation of the nonvolatile resistive state in bipolar resistive-switching oxide-based memories |
Autor: | Schulman, A.; Rozenberg, M.J.; Acha, C. |
Filiación: | Departamento de Física, Facultad de Ciencias Exactas y Naturales, Ciudad Universitaria, C1428EHA Buenos Aires, Argentina Laboratoire de Physique des Solides, UMR8502 Université Paris-Sud, Orsay 91405, France
|
Año: | 2012
|
Volumen: | 86
|
Número: | 10
|
DOI: |
http://dx.doi.org/10.1103/PhysRevB.86.104426 |
Título revista: | Physical Review B - Condensed Matter and Materials Physics
|
Título revista abreviado: | Phys. Rev. B Condens. Matter Mater. Phys.
|
ISSN: | 10980121
|
CODEN: | PRBMD
|
Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_10980121_v86_n10_p_Schulman |
Referencias:
- Burr, G.W., Kurdi, B.N., Scott, J.C., Lam, C.H., Gopalakrishnan, K., Shenoy, R.S., (2008) IBM J. Res. Dev., 52, p. 449. , IBMJAE 0018-8646 10.1147/rd.524.0449
- Lai, S.K., (2008) IBM J. Res. Dev., 52, p. 529. , IBMJAE 0018-8646 10.1147/rd.524.0529
- Waser, R., Aono, M., Nanoionics-based resistive switching memories (2007) Nature Materials, 6 (11), pp. 833-840. , DOI 10.1038/nmat2023, PII NMAT2023
- Sawa, A., Resistive switching in transition metal oxides (2008) Materials Today, 11 (6), pp. 28-36. , DOI 10.1016/S1369-7021(08)70119-6, PII S1369702108701196
- Nian, Y.B., Strozier, J., Wu, N.J., Chen, X., Ignatiev, A., Evidence for an oxygen diffusion model for the electric pulse induced resistance change effect in transition-metal oxides (2007) Physical Review Letters, 98 (14), p. 146403. , http://oai.aps.org/oai?verb=GetRecord&Identifier=oai:aps.org: PhysRevLett.98.146403&metadataPrefix=oai_apsmeta_2, DOI 10.1103/PhysRevLett.98.146403
- Porcar, L., Bourgault, D., Tournier, R., Barbut, J.M., Barrault, M., Germi, P., (1997) Physica C, 275, p. 1997. , PHYCE6 0921-4534 10.1016/S0921-4534(96)00720-4
- Acha, C., Rozenberg, M.J., (2009) J. Phys.: Condens. Matter, 21, p. 045702. , JCOMEL 0953-8984 10.1088/0953-8984/21/4/045702
- Acha, C., (2009) Physica B, 404, p. 2746. , PHYBE3 0921-4526 10.1016/j.physb.2009.06.111
- Acha, C., (2011) J. Phys. D: Appl. Phys., 44, p. 345301. , JPAPBE 0022-3727 10.1088/0022-3727/44/34/345301
- Avrami, M., (1940) J. Chem. Phys., 8, p. 212. , JCPSA6 0021-9606 10.1063/1.1750631
- Rozenberg, M.J., Sánchez, M.J., Weht, R., Acha, C., Gomez-Marlasca, F., Levy, P., (2010) Phys. Rev. B, 81, p. 115101. , PRBMDO 1098-0121 10.1103/PhysRevB.81.115101
- Balagurov, B.Y., Vaks, V.G., (1974) JETP, 38, p. 968
- Donsker, M.D., Varadhan, S.R.S., (1975) Commun. Pure Appl. Math., 28, p. 525. , 0010-3640 10.1002/cpa.3160280406
- Berezhkovskii, A., Makhnovskii, Y., Suris, R., (1989) Chem. Phys., 137, p. 41. , CMPHC2 0301-0104 10.1016/0301-0104(89)87091-0
- Yuste, S.B., Oshanin, G., Lindenberg, K., Bénichou, O., Klafter, J., (2008) Phys. Rev. e, 78, p. 021105. , PLEEE8 1539-3755 10.1103/PhysRevE.78.021105
- Mogilevsky, R., Levi-Setti, R., Pashmakov, B., Liu, L., Zhang, K., Jaeger, H.M., Buchholz, D.B., Veal, B.W., (1994) Phys. Rev. B, 49, p. 6420. , PRBMDO 1098-0121 10.1103/PhysRevB.49.6420
- Ottaviani, G., Nobili, C., Nava, F., Affronte, M., Manfredini, T., Matacotta, F.C., Galli, E., (1989) Phys. Rev. B, 39, p. 9069. , PRBMDO 1098-0121 10.1103/PhysRevB.39.9069
- Zhang, J.X., Lin, G.M., Lin, Z.C., Liang, K.F., Fung, P.C.W., Siu, G.G., (1989) J. Phys.: Condens. Matter, 1, p. 6939. , JCOMEL 0953-8984 10.1088/0953-8984/1/39/004
Citas:
---------- APA ----------
Schulman, A., Rozenberg, M.J. & Acha, C.
(2012)
. Anomalous time relaxation of the nonvolatile resistive state in bipolar resistive-switching oxide-based memories. Physical Review B - Condensed Matter and Materials Physics, 86(10).
http://dx.doi.org/10.1103/PhysRevB.86.104426---------- CHICAGO ----------
Schulman, A., Rozenberg, M.J., Acha, C.
"Anomalous time relaxation of the nonvolatile resistive state in bipolar resistive-switching oxide-based memories"
. Physical Review B - Condensed Matter and Materials Physics 86, no. 10
(2012).
http://dx.doi.org/10.1103/PhysRevB.86.104426---------- MLA ----------
Schulman, A., Rozenberg, M.J., Acha, C.
"Anomalous time relaxation of the nonvolatile resistive state in bipolar resistive-switching oxide-based memories"
. Physical Review B - Condensed Matter and Materials Physics, vol. 86, no. 10, 2012.
http://dx.doi.org/10.1103/PhysRevB.86.104426---------- VANCOUVER ----------
Schulman, A., Rozenberg, M.J., Acha, C. Anomalous time relaxation of the nonvolatile resistive state in bipolar resistive-switching oxide-based memories. Phys. Rev. B Condens. Matter Mater. Phys. 2012;86(10).
http://dx.doi.org/10.1103/PhysRevB.86.104426