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Abstract:

The thickness W and the surface energy σA at the free interface of superfluid 4He are studied. Results of calculations carried out using density functionals for cylindrical and spherical systems are presented in a unified way, including a comparison with the behavior of planar slabs. It is found that for large species W is independent of the geometry. The obtained values of W are compared with prior theoretical results and experimental data. Experimental data favor results evaluated by adopting finite range approaches. The behavior of σA and WσA exhibits overshoots similar to that found previously for the central density, and the trend of these observables towards their asymptotic values is examined. © 2003 The American Physical Society.

Registro:

Documento: Artículo
Título:Curvature effects on the surface thickness and tension at the free interface of 4He systems
Autor:Szybisz, L.; Urrutia, I.
Filiación:Laboratorio TANDAR, Departamento de Física, Comisión Nacional de Energía Atómica, Av. Del Libertador 8250, Buenos Aires, RA-1429, Argentina
Departamento de Física, Facultad de Ciencias Exactas y Naturales, Universidad de Buenos Aires, Ciudad Universitaria, Buenos Aires, RA-1428, Argentina
Carrera del Investigador Científico of the Consejo Nacional de Investigaciones Científicas y Técnicas, Av. Rivadavia 1917, Buenos Aires, RA-1033, Argentina
Comisión de Investigaciones Científicas de la Prov. De Buenos Aires, Calle 526 entre 10 y 11, La Plata, RA-1900, Argentina
Palabras clave:helium; article; calculation; conductor; density; energy; experiment; geometry; liquid; surface property; tension; thickness
Año:2003
Volumen:68
Número:5
DOI: http://dx.doi.org/10.1103/PhysRevB.68.054518
Título revista:Physical Review B - Condensed Matter and Materials Physics
Título revista abreviado:Phys. Rev. B Condens. Matter Mater. Phys.
ISSN:10980121
CAS:helium, 7440-59-7
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_10980121_v68_n5_p_Szybisz

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Citas:

---------- APA ----------
Szybisz, L. & Urrutia, I. (2003) . Curvature effects on the surface thickness and tension at the free interface of 4He systems. Physical Review B - Condensed Matter and Materials Physics, 68(5).
http://dx.doi.org/10.1103/PhysRevB.68.054518
---------- CHICAGO ----------
Szybisz, L., Urrutia, I. "Curvature effects on the surface thickness and tension at the free interface of 4He systems" . Physical Review B - Condensed Matter and Materials Physics 68, no. 5 (2003).
http://dx.doi.org/10.1103/PhysRevB.68.054518
---------- MLA ----------
Szybisz, L., Urrutia, I. "Curvature effects on the surface thickness and tension at the free interface of 4He systems" . Physical Review B - Condensed Matter and Materials Physics, vol. 68, no. 5, 2003.
http://dx.doi.org/10.1103/PhysRevB.68.054518
---------- VANCOUVER ----------
Szybisz, L., Urrutia, I. Curvature effects on the surface thickness and tension at the free interface of 4He systems. Phys. Rev. B Condens. Matter Mater. Phys. 2003;68(5).
http://dx.doi.org/10.1103/PhysRevB.68.054518