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Abstract:

In this paper we characterize the Polarimetric properties of a liquid crystal on silicon display (LCoS), including depolarization and diattenuation which are usually not considered when applying the LCoS in diffractive or adaptive optics. On one hand, we have found that the LCoS generates a certain degree (that can be larger than a 10%) of depolarized light, which depends on the addressed gray level and on the incident state of polarization (SOP), and can not be ignored in the above mentioned applications. The main origin of the depolarized light is related with temporal fluctuations of the SOP of the light reflected by the LCoS. The Mueller matrix of the LCoS is measured as a function of the gray level, which enables for a numerical optimization of the intensity modulation configurations. In particular we look for maximum intensity contrast modulation or for constant intensity modulation. By means of a heuristic approach we show that, using elliptically polarized light, amplitude-mostly or phase-mostly modulation can be obtained at a wavelength of 633 nm. ©2007 Optical Society of America.

Registro:

Documento: Artículo
Título:Mueller-Stokes characterization and optimization of a liquid crystal on silicon display showing depolarization
Autor:Márquez, A.; Moreno, I.; Iemmi, C.; Lizana, A.; Campos, J.; Yzuel, M.J.
Filiación:Dept. de Física, Ingeniería de Sistemas y Teoría de la Señal, Universidad de Alicante, Ap. 99, 03080 Alicante, Spain
Dept. de Ciencia de Materiales, Óptica y Tecnología Electrónica, Universidad Miguel Hernández, Elche, Spain
Dept. de Física, Fac. de Ciencias Exactas y Naturales, Universidad de Buenos Aires, 1428 Buenos Aires, Argentina
Departamento de Física, Universidad Autónorna de Barcelona, 08193 Bellaterra, Spain
Palabras clave:Adaptive optics; Characterization; Depolarization; Light modulation; Optimization; Phase matching; Depolarized light; Diattenuation; Liquid crystal on silicon display (LCoS); Mueller-Stokes characterization; State of polarization (SOP); Liquid crystal displays; silicon; article; chemistry; computer aided design; equipment; equipment design; instrumentation; liquid crystal; refractometry; theoretical model; Computer-Aided Design; Equipment Design; Equipment Failure Analysis; Liquid Crystals; Models, Theoretical; Refractometry; Silicon
Año:2008
Volumen:16
Número:3
Página de inicio:1669
Página de fin:1685
DOI: http://dx.doi.org/10.1364/OE.16.001669
Título revista:Optics Express
Título revista abreviado:Opt. Express
ISSN:10944087
CAS:silicon, 7440-21-3; Silicon, 7440-21-3
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_10944087_v16_n3_p1669_Marquez

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Citas:

---------- APA ----------
Márquez, A., Moreno, I., Iemmi, C., Lizana, A., Campos, J. & Yzuel, M.J. (2008) . Mueller-Stokes characterization and optimization of a liquid crystal on silicon display showing depolarization. Optics Express, 16(3), 1669-1685.
http://dx.doi.org/10.1364/OE.16.001669
---------- CHICAGO ----------
Márquez, A., Moreno, I., Iemmi, C., Lizana, A., Campos, J., Yzuel, M.J. "Mueller-Stokes characterization and optimization of a liquid crystal on silicon display showing depolarization" . Optics Express 16, no. 3 (2008) : 1669-1685.
http://dx.doi.org/10.1364/OE.16.001669
---------- MLA ----------
Márquez, A., Moreno, I., Iemmi, C., Lizana, A., Campos, J., Yzuel, M.J. "Mueller-Stokes characterization and optimization of a liquid crystal on silicon display showing depolarization" . Optics Express, vol. 16, no. 3, 2008, pp. 1669-1685.
http://dx.doi.org/10.1364/OE.16.001669
---------- VANCOUVER ----------
Márquez, A., Moreno, I., Iemmi, C., Lizana, A., Campos, J., Yzuel, M.J. Mueller-Stokes characterization and optimization of a liquid crystal on silicon display showing depolarization. Opt. Express. 2008;16(3):1669-1685.
http://dx.doi.org/10.1364/OE.16.001669