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Abstract:

An inexpensive sample holder for resistivity and Hall factor measurements is described. Its simple design prevents thermo-EMFS and makes its construction feasible in a short time.

Registro:

Documento: Artículo
Título:Sample holder for resistivity and Hall factor measurements at high temperatures
Autor:Lembo, R.; Caselli, E.; Feder, A.; Distefano, A.
Filiación:Dept. de Fisica, Fac. de Ciencias Exactas y Naturales, Buenos Aires, Argentina
Palabras clave:Sample Holders; Crystals; Hall Effect - Thermal Effects; High Temperature Engineering; Semiconducting Silicon; Electric Conductivity
Año:1990
Volumen:1
Número:12
Página de inicio:1373
Página de fin:1374
DOI: http://dx.doi.org/10.1088/0957-0233/1/12/021
Título revista:Measurement Science and Technology
ISSN:09570233
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_09570233_v1_n12_p1373_Lembo

Referencias:

  • Hyde, GR, Rao, VG, (1970) Rev. Sci. Instrum., 41 (4), p. 593
  • Morin, FJ, Maita, JP, (1954) Phys. Rev., 96, p. 28
  • Word, G, High temperature Hall-effect apparatus (1984) Review of Scientific Instruments, 55 (1), p. 110

Citas:

---------- APA ----------
Lembo, R., Caselli, E., Feder, A. & Distefano, A. (1990) . Sample holder for resistivity and Hall factor measurements at high temperatures. Measurement Science and Technology, 1(12), 1373-1374.
http://dx.doi.org/10.1088/0957-0233/1/12/021
---------- CHICAGO ----------
Lembo, R., Caselli, E., Feder, A., Distefano, A. "Sample holder for resistivity and Hall factor measurements at high temperatures" . Measurement Science and Technology 1, no. 12 (1990) : 1373-1374.
http://dx.doi.org/10.1088/0957-0233/1/12/021
---------- MLA ----------
Lembo, R., Caselli, E., Feder, A., Distefano, A. "Sample holder for resistivity and Hall factor measurements at high temperatures" . Measurement Science and Technology, vol. 1, no. 12, 1990, pp. 1373-1374.
http://dx.doi.org/10.1088/0957-0233/1/12/021
---------- VANCOUVER ----------
Lembo, R., Caselli, E., Feder, A., Distefano, A. Sample holder for resistivity and Hall factor measurements at high temperatures. 1990;1(12):1373-1374.
http://dx.doi.org/10.1088/0957-0233/1/12/021