Conferencia
Peinado, A.; Lizana, A.; Vidal, J.; Iemmi, C.; Márquez, A.; Morenoe, I.; Camposa, J. "Variable waveplate-based polarimeter for polarimetric metrology" (2009) Modeling Aspects in Optical Metrology II. 7390
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Abstract:
Polarimetry is an optical technique currently used in many research fields as biomedicine, polarimetric metrology or material characterization, where the knowledge of the state of polarization of light beams and the polarizing properties of polarizing samples is required. As a consequence, in such as applications it is necessary to use polarimeters which by means of radiomentric measurements, lead to the obtaining of some important polarimetric information. As is known, polarimeters include a state of polarization detector (PSD), which is typically formed by combinations of waveplates and polarizers. Then, intensity measurements corresponding to the projection of the analyzed state of polarization upon different configurations of the PSD used, leads to the determination of the polarimetric properties of light beams. Here, we have studied and optimized a polarimeter based on PSD system containing two electronically variable retardance waveplates. The variable waveplates are based on the Liquid Crystal Display technology, allowing the implementation of a complete polarimeter without mechanical movements. © 2009 SPIE.
Registro:
| Documento: | Conferencia |
| Título: | Variable waveplate-based polarimeter for polarimetric metrology |
| Autor: | Peinado, A.; Lizana, A.; Vidal, J.; Iemmi, C.; Márquez, A.; Morenoe, I.; Camposa, J. |
| Ciudad: | Munich |
| Filiación: | Dept. de Física, Universitat Autònoma de Barcelona, 08193, Bellaterra, Spain ALBA Synchrotron Light Source Facility, Cerdanyola del Vallès, 08290, Spain Dept. de Física, Universidad de Buenos Aires, 1428, Buenos Aires, Argentina Dept. de Física, Universidad de Alicante, 03080 Alicante, Spain Dept. de Ciencia de Materiales, Ópt. y Tec. Electrónica, Univ. Miguel Hernández, Elche, Spain |
| Palabras clave: | LCD; Polarimeter; State of polarization; Stokes vector; Variable waveplate; Intensity measurements; LCD; Light beam; Material characterizations; Mechanical movements; Optical technique; Research fields; Retardance; State of polarization; Stokes vector; Variable waveplate; Waveplates; Dendrites (metallography); Liquid crystal displays; Liquid crystals; Measurements; Optical properties; Polarization; Polarographic analysis; Power spectral density; Pulse shaping circuits; Polarimeters |
| Año: | 2009 |
| Volumen: | 7390 |
| DOI: | http://dx.doi.org/10.1117/12.828045 |
| Título revista: | Modeling Aspects in Optical Metrology II |
| Título revista abreviado: | Proc SPIE Int Soc Opt Eng |
| ISSN: | 0277786X |
| CODEN: | PSISD |
| Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0277786X_v7390_n_p_Peinado |
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Citas:
---------- APA ----------
Peinado, A., Lizana, A., Vidal, J., Iemmi, C., Márquez, A., Morenoe, I. & Camposa, J. (2009) . Variable waveplate-based polarimeter for polarimetric metrology. Modeling Aspects in Optical Metrology II, 7390.http://dx.doi.org/10.1117/12.828045
---------- CHICAGO ----------
Peinado, A., Lizana, A., Vidal, J., Iemmi, C., Márquez, A., Morenoe, I., et al. "Variable waveplate-based polarimeter for polarimetric metrology" . Modeling Aspects in Optical Metrology II 7390 (2009).http://dx.doi.org/10.1117/12.828045
---------- MLA ----------
Peinado, A., Lizana, A., Vidal, J., Iemmi, C., Márquez, A., Morenoe, I., et al. "Variable waveplate-based polarimeter for polarimetric metrology" . Modeling Aspects in Optical Metrology II, vol. 7390, 2009.http://dx.doi.org/10.1117/12.828045
---------- VANCOUVER ----------
Peinado, A., Lizana, A., Vidal, J., Iemmi, C., Márquez, A., Morenoe, I., et al. Variable waveplate-based polarimeter for polarimetric metrology. Proc SPIE Int Soc Opt Eng. 2009;7390.http://dx.doi.org/10.1117/12.828045
