The distortion of a signal due to noise contamination can be overcome by using a decomposition of the signal in a base of wavelets. If the decomposition coefficients are small compared with the noise, the scene is dominated by the distortion. On the contrary, if they are bigger in absolute value, the signal is stronger that the noise. A way of reconstructing an image with a lower level of noise is accomplished neglecting the coefficients which values are lower than a threshold, and replacing them by zero. In this work we present a method that applies the thresholding of the wavelet coefficients in order to perform pattern recognition of noisy scenes. The method could be implemented in optical processing by using a Vander Lugt correlator architecture operating with liquid crystal displays. The function to be recognized is decomposed in sub-bands based on the Gabor decomposition, in the frequency plane. Hard thresholding is performed and the threshold is generated with accurate support functions in the filter plane. The criterion for the threshold selection is chosen to optimize the signal to noise ratio in the output plane. Numerical simulations results are shown and comparisons with other filters are made.
Documento: | Conferencia |
Título: | Wavelet coefficients thresholding method applied to the correlation of noisy scenes |
Autor: | Mazzaferri, J.; Ledesma, S. |
Ciudad: | Porlamar |
Filiación: | Depto. de Fis. J. J. Giambiagi, Fac. de Ciencias Exactas y Naturales, Universidad de Buenos Aires, Argentina |
Palabras clave: | Nonlinear optical signal processing; Optical correlators; Optical imaging processing; Pattern recognition and feature extraction; Nonlinear optical signal processing; Optical correlators; Optical imaginng processing; Pattern recognition and feature extraction; Distortion (waves); Feature extraction; Functions; Image analysis; Mathematical models; Nonlinear optics; Optical correlation; Signal processing; Signal to noise ratio; Spurious signal noise; Threshold elements; Wavelet transforms; Pattern recognition |
Año: | 2004 |
Volumen: | 5622 |
Número: | PART 2 |
Página de inicio: | 617 |
Página de fin: | 621 |
DOI: | http://dx.doi.org/10.1117/12.591703 |
Título revista: | RIAO/OPTILAS 2004: 5th Iberoamerican Meeting on Optics, and 8th Latin American Meeting on Optics, Lasers, and their Applications; ICO Regional Meeting |
Título revista abreviado: | Proc SPIE Int Soc Opt Eng |
ISSN: | 0277786X |
CODEN: | PSISD |
Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0277786X_v5622_nPART2_p617_Mazzaferri |