Abstract:
Existing optical scanning microscopes don't allow the determination of the depth below the surface of the sample under which where scatterers might be located, due to the simple exponential decay of their evanescent probing field. We propose a nonlinear near field microscope which would allow three dimensional images of buried structrures with nanometric resolution along all dimensions.
Registro:
Documento: |
Conferencia
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Título: | Nonlinear optical nanoscope with depth resolution |
Autor: | Mochán, W.L.; López-Bastidas, C.; Maytorena, J.A.; Mendoza, B.S.; Brudny, V.L. |
Ciudad: | Porlamar |
Filiación: | Centro de Ciencias Físicas, UNAM, Mexico Ctro. de Cie. de la Mat. Condensada, UNAM, Mexico Centro de Investigaciones en Optica, Mexico Depto. de Física y FCEyN, UBA, Argentina Centro de Ciencias Físicas, Univ. Nac. Auton. de Mexico, Apartado Postal 48-3, 62251 Cuernavaca, Morelos, Mexico
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Palabras clave: | Nanoscope; Near field optical microscope; Surface optical second harmonic generation; Imaging techniques; Light propagation; Near field scanning optical microscopy; Optical fibers; Optical resolving power; Optical waveguides; Scanning tunneling microscopy; Second harmonic generation; Sensitivity analysis; Thin films; Three dimensional computer graphics; Nonlinear optical nanoscopes; Scanning near-field optical microscopes (SNOM); Second harmonic (SH); Surface optical second harmonic generations; Nonlinear optics |
Año: | 2004
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Volumen: | 5622
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Número: | PART 1
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Página de inicio: | 524
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Página de fin: | 528
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DOI: |
http://dx.doi.org/10.1117/12.590745 |
Título revista: | RIAO/OPTILAS 2004: 5th Iberoamerican Meeting on Optics, and 8th Latin American Meeting on Optics, Lasers, and their Applications; ICO Regional Meeting
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Título revista abreviado: | Proc SPIE Int Soc Opt Eng
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ISSN: | 0277786X
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CODEN: | PSISD
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Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0277786X_v5622_nPART1_p524_Mochan |
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Citas:
---------- APA ----------
Mochán, W.L., López-Bastidas, C., Maytorena, J.A., Mendoza, B.S. & Brudny, V.L.
(2004)
. Nonlinear optical nanoscope with depth resolution. RIAO/OPTILAS 2004: 5th Iberoamerican Meeting on Optics, and 8th Latin American Meeting on Optics, Lasers, and their Applications; ICO Regional Meeting, 5622(PART 1), 524-528.
http://dx.doi.org/10.1117/12.590745---------- CHICAGO ----------
Mochán, W.L., López-Bastidas, C., Maytorena, J.A., Mendoza, B.S., Brudny, V.L.
"Nonlinear optical nanoscope with depth resolution"
. RIAO/OPTILAS 2004: 5th Iberoamerican Meeting on Optics, and 8th Latin American Meeting on Optics, Lasers, and their Applications; ICO Regional Meeting 5622, no. PART 1
(2004) : 524-528.
http://dx.doi.org/10.1117/12.590745---------- MLA ----------
Mochán, W.L., López-Bastidas, C., Maytorena, J.A., Mendoza, B.S., Brudny, V.L.
"Nonlinear optical nanoscope with depth resolution"
. RIAO/OPTILAS 2004: 5th Iberoamerican Meeting on Optics, and 8th Latin American Meeting on Optics, Lasers, and their Applications; ICO Regional Meeting, vol. 5622, no. PART 1, 2004, pp. 524-528.
http://dx.doi.org/10.1117/12.590745---------- VANCOUVER ----------
Mochán, W.L., López-Bastidas, C., Maytorena, J.A., Mendoza, B.S., Brudny, V.L. Nonlinear optical nanoscope with depth resolution. Proc SPIE Int Soc Opt Eng. 2004;5622(PART 1):524-528.
http://dx.doi.org/10.1117/12.590745