Abstract:
When a light beam is incident on an interface uniaxial crystal-isotropic medium, unlike isotropic interfaces, a double reflection takes place. If the incident wave is extraordinary, the propagation velocity of the four intervening waves (extraordinary incident, ordinary reflected, extraordinary reflected and transmitted) are different originating greater asymmetries than those appearing when the incident wave is ordinary. If, additionally, the light beam is incident under conditions of inhibited reflection, the analysis of the polarization of the waves present is of interest since the ordinary reflected wave is evanescent and the polarization of the refracted wave is elliptical. In this article the attenuation undergone by the ordinary reflected wave when it withdraws from the interface is shown; the eccentricity and the direction of the larger axis of the polarization ellipse of the refracted wave is calculated; and its dependence on the incidence angle and on the orientation of the optical axis of the crystal is analyzed.
Registro:
Documento: |
Conferencia
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Título: | Analysis of the polarization of waves under inhibited reflection conditions: Extraordinary incidence |
Autor: | Vanney, C.; Simon, M.C.; Kaufmann G.H. |
Ciudad: | Tandil |
Filiación: | Laboratorio de Optica, Ciudad Universitaria, Universidad de Buenos Aires, 1428 Buenos Aires, Argentina
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Palabras clave: | Inhibited reflection; Polarization; Uniaxial crystals; Crystal orientation; Crystals; Interfaces (materials); Light propagation; Light reflection; Light refraction; Inhibited reflection; Uniaxial crystals; Light polarization |
Año: | 2001
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Volumen: | 4419
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Página de inicio: | 458
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Página de fin: | 461
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DOI: |
http://dx.doi.org/10.1117/12.437099 |
Título revista: | 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications
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Título revista abreviado: | Proc SPIE Int Soc Opt Eng
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ISSN: | 0277786X
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CODEN: | PSISD
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Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0277786X_v4419_n_p458_Vanney |
Referencias:
- Simon, M.C., Ray tracing formulas for monoaxial optical components (1983) Appl. Opt., 22, p. 354
- Simon, M.C., Echarri, R.M., Internal reflection in uniaxial crystals III: Coefficients of transmission anal reflection for an extraordinary incident wave (1990) Jour. Mod. Opt., 37 (6), pp. 1139-1148
- Simon, M.C., Echarri, R.M., Inhibited reflection in uniaxial crystals (1989) Opt. Lett., 14 (5), pp. 257-259
- Perez, L.I., Simon, M.C., Vanney, C.E., Evanescent waves associated to internal reflection in uniaxial crystals (1996) SPIE, 2730, pp. 183-186
- Simon, M.C., Simon, J.M., Perez, L.I., Vanney, C.E., Elliptic polarization of refracted wave in prescence of inhibited reflection (1998) Jour. Mod. Opt., 45 (1), pp. 35-43A4 - SPIE; Laseroptics SA (Argentina); Optical Society of America; International Commission for Optics; Spectra-Physics GmbH (Germany)
Citas:
---------- APA ----------
Vanney, C., Simon, M.C. & Kaufmann G.H.
(2001)
. Analysis of the polarization of waves under inhibited reflection conditions: Extraordinary incidence. 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, 4419, 458-461.
http://dx.doi.org/10.1117/12.437099---------- CHICAGO ----------
Vanney, C., Simon, M.C., Kaufmann G.H.
"Analysis of the polarization of waves under inhibited reflection conditions: Extraordinary incidence"
. 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications 4419
(2001) : 458-461.
http://dx.doi.org/10.1117/12.437099---------- MLA ----------
Vanney, C., Simon, M.C., Kaufmann G.H.
"Analysis of the polarization of waves under inhibited reflection conditions: Extraordinary incidence"
. 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, vol. 4419, 2001, pp. 458-461.
http://dx.doi.org/10.1117/12.437099---------- VANCOUVER ----------
Vanney, C., Simon, M.C., Kaufmann G.H. Analysis of the polarization of waves under inhibited reflection conditions: Extraordinary incidence. Proc SPIE Int Soc Opt Eng. 2001;4419:458-461.
http://dx.doi.org/10.1117/12.437099