Abstract:
Laser interferometry allows the recording of the electron density in a great variety of plasmas. However, the absorption and refraction imposes a limitation to the maximum density, plasma size and plasma gradient that can be measured with this technique. The development of compact soft X-ray laser sources gives the opportunity to extend the limits of plasma interferometry, probing plasmas with high densities and steep gradients. We present results of plasma interferometry using an amplitude division interferometer and a table top soft X-ray laser. The interferometer is a modified Mach-Zehnder configuration with diffraction gratings used as beam splitters. The soft X-ray laser is a 46.9 nm capillary discharge table-top laser. The set up was used to probe a laser-created plasma with a temporal resolution of ∼1 ns and densities up to 6 1020 cm-3. © 2001 SPIE · 0277-786X/01/$15.00.
Registro:
Documento: |
Artículo
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Título: | Soft X-ray laser interferometer used for dense plasma diagnostics |
Autor: | Marconi, M.; Filevich, J.; Rocca, J.J.; Jankowska, E.; Hammerstein, E.; Kanizay, K.; Chilla, J.L.A. |
Filiación: | Depto. De Física, Facultad de Ciencias Exactas y Naturales, Univ. De Buenos Aires, Argentina Electrical and Computer Engineering Dept, Colorado State University, Fort Collins, CO, United States Coherent Laser Div, Auburn, CA, United States
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Palabras clave: | Laser interferometry; X-ray laser; Carrier concentration; Interferometry; Light absorption; Light reflection; Plasma diagnostics; Laser interferometry; X ray lasers |
Año: | 2001
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Volumen: | 4419
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Página de inicio: | 106
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Página de fin: | 109
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DOI: |
http://dx.doi.org/10.1117/12.437142 |
Título revista: | Proceedings of SPIE-The International Society for Optical Engineering
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Título revista abreviado: | Proc SPIE Int Soc Opt Eng
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ISSN: | 0277786X
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Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0277786X_v4419_n_p106_Marconi |
Referencias:
- Soft X-ray lasers and applications II (1997) SPIE Journal, 3156. , Editors J.J. Rocca and L.B. Da Silva
- X-ray lasers 1996 (1996) Institute of Physics Conference Series, 151. , Editores S. Svanberg and C.G. Wahlstrom
- Celliers, P., Weber, F., Da Silva, L.B., Barbee, T.W., Jr., Cauble, R., Wan, A.S., Moreno, J.C., Fringe formation and coherence of a soft-x-ray laser beam illuminating a Mach-Zehnder interferometer (1995) Optics Letters, 20, p. 1907
- DaSilva, L.B., Barbee, T.W., Jr., Cauble, R., Celliers, P., Ciarlo, D., Libby, S., London, R.A., Weber, F., (1995) Phys. Rev. Lett, 74, p. 3991
- Chilla, J.L.A., Rocca, J.J., Martinez, O.E., Marconi, M.C., Soft X-ray interferometer for single-shot laser linewidth measurements (1996) Optics Letters, 21, p. 955
- Martinez, O.E., Gordon, J.P., Fork, R.L., (1984) J. Opt. Soc. Am. A, 1, pp. 1003-1008
- Filevich, J., Kanizay, K., Chilla, J.L.A., Rocca, J.J., (2000) Optics Letters, 25, p. 356
Citas:
---------- APA ----------
Marconi, M., Filevich, J., Rocca, J.J., Jankowska, E., Hammerstein, E., Kanizay, K. & Chilla, J.L.A.
(2001)
. Soft X-ray laser interferometer used for dense plasma diagnostics. Proceedings of SPIE-The International Society for Optical Engineering, 4419, 106-109.
http://dx.doi.org/10.1117/12.437142---------- CHICAGO ----------
Marconi, M., Filevich, J., Rocca, J.J., Jankowska, E., Hammerstein, E., Kanizay, K., et al.
"Soft X-ray laser interferometer used for dense plasma diagnostics"
. Proceedings of SPIE-The International Society for Optical Engineering 4419
(2001) : 106-109.
http://dx.doi.org/10.1117/12.437142---------- MLA ----------
Marconi, M., Filevich, J., Rocca, J.J., Jankowska, E., Hammerstein, E., Kanizay, K., et al.
"Soft X-ray laser interferometer used for dense plasma diagnostics"
. Proceedings of SPIE-The International Society for Optical Engineering, vol. 4419, 2001, pp. 106-109.
http://dx.doi.org/10.1117/12.437142---------- VANCOUVER ----------
Marconi, M., Filevich, J., Rocca, J.J., Jankowska, E., Hammerstein, E., Kanizay, K., et al. Soft X-ray laser interferometer used for dense plasma diagnostics. Proc SPIE Int Soc Opt Eng. 2001;4419:106-109.
http://dx.doi.org/10.1117/12.437142