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Abstract:

In this work we compare two different detection schemes that are sensitive to the focus shift of a probe beam due to induced surface curvature. The technique on which both detection schemes are based is called ThERM (Thermal Expansion-Recovery Microscopy) and allows the retrieval of the thermal diffusivity at microscopic levels, hence mapping such magnitude over a sample surface. The induced thermal expansion defocuses the probe beam due to the surface deformation (curvature). The dependence of the defocusing with the pump modulation frequency yields the thermal diffusivity of the sample at the impinging location. The explored depth is controlled by the pump beam size. By scanning both beams, a complete map of the thermal diffusivity can be retrieved. © 2013 Materials Research Society.

Registro:

Documento: Conferencia
Título:Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization
Autor:Domené, E.A.; Mingolo, N.; Martínez, O.E.
Ciudad:Boston, MA
Filiación:Laboratorio de Electrónica Cuántica (LEC), Departamento de Física, Facultad de Ciencias Exactas Y Naturales, Universidad de Buenos Aires (UBA), Buenos Aires, Argentina
Departamento de Física, Facultad de Ingeniería, Universidad de Buenos Aires (UBA), Buenos Aires, Argentina
Tolket SRL, Int. Güiraldes 2160, Ciudad. Universitaria, Buenos Aires, Argentina
Palabras clave:Probes; Thermal diffusivity; Defocusing; Detection scheme; Micro-structural characterization; Microscopic levels; Pump modulation; Sample surface; Surface curvatures; Surface deformation; Thermal expansion
Año:2013
Volumen:1526
Página de inicio:47
Página de fin:52
DOI: http://dx.doi.org/10.1557/opl.2013.540
Título revista:2012 MRS Fall Meeting
Título revista abreviado:Mater Res Soc Symp Proc
ISSN:02729172
CODEN:MRSPD
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_02729172_v1526_n_p47_Domene

Referencias:

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  • Mingolo, N., Martínez, O.E., (2012) J. Appl. Phys., 111, p. 123526
  • Domené, E.A., Martínez, O.E., (2013) Rev. Sci. Instrum., 84, p. 016104
  • Domené, E.A., Balzarotti, F., Bragas, A.V., Martínez, O.E., (2009) Opt. Lett., 34, pp. 3797-3799
  • Archiopoli, U.C., Mingolo, N., Martínez, O.E., (2011) Surf. Coat. Technol., 205, p. 3087A4 -

Citas:

---------- APA ----------
Domené, E.A., Mingolo, N. & Martínez, O.E. (2013) . Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization. 2012 MRS Fall Meeting, 1526, 47-52.
http://dx.doi.org/10.1557/opl.2013.540
---------- CHICAGO ----------
Domené, E.A., Mingolo, N., Martínez, O.E. "Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization" . 2012 MRS Fall Meeting 1526 (2013) : 47-52.
http://dx.doi.org/10.1557/opl.2013.540
---------- MLA ----------
Domené, E.A., Mingolo, N., Martínez, O.E. "Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization" . 2012 MRS Fall Meeting, vol. 1526, 2013, pp. 47-52.
http://dx.doi.org/10.1557/opl.2013.540
---------- VANCOUVER ----------
Domené, E.A., Mingolo, N., Martínez, O.E. Thermal Expansion-Recovery Microscopy (ThERM) for microstructural characterization. Mater Res Soc Symp Proc. 2013;1526:47-52.
http://dx.doi.org/10.1557/opl.2013.540