Artículo

Estamos trabajando para incorporar este artículo al repositorio
Consulte el artículo en la página del editor
Consulte la política de Acceso Abierto del editor

Abstract:

La 0.7 Sr 0.3 CoO 3 (LSCO) thin films have been epitaxially grown on SrTiO 3 (STO) and LaAlO 3 (LAO) substrates by metal organic deposition. The effects of the strain - induced by clamping - on the structural and physical properties of the films were studied. For that, we have performed resistivity and magnetization studies as a function of temperature and magnetic field as well as X-ray diffraction and Raman spectroscopy measurements. Our X-ray results are similar for both substrates showing that the 20 nm films are fully strained while thicker films have two components corresponding to a fully strained and a relaxed component. Relaxation induced by increasing film thickness (up to 100 nm) results in a systematic evolution of the out of plane crystallographic cell parameter toward the bulk LSCO values. Raman spectra of the thinner films exhibit specific modes which are not present in the bulk LSCO spectra. These modes disappear for thicker films which are totally relaxed. All the samples show similar magnetic behavior independently of the thickness and the substrate with a Curie temperature (T C ) around 210 K. Relative changes in resistivity due to the film thickness are larger than 3 orders of magnitude with a relatively small influence of the type of strain induced by the substrate (compressive or tensile). Moreover whereas the relaxed film (100 nm thick) shows similar transport properties as the bulk sample, the fully strained film (20 nm thick) shows a 3D variable range hopping conduction with a higher degree of localization which is a direct result of the strain state. © 2014 Elsevier B.V. All rights reserved.

Registro:

Documento: Artículo
Título:Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates
Autor:Othmen, Z.; Schulman, A.; Daoudi, K.; Boudard, M.; Acha, C.; Roussel, H.; Oueslati, M.; Tsuchiya, T.
Filiación:Unité Nanomatériaux et Photonique, Faculté des Sciences de Tunis, 2092 El Manar Tunis, Tunisia
Laboratoire des Matériaux et du Génie Physique, UMR 5628 CNRS-UDG-Grenoble INP, Minatec, 3, Parvis Louis Néel, CS 50257, 38016 Grenoble Cedex 1, France
Departamento de Física, FCEyN, IFIBA, Pabellón 1, 1428 Buenos Aires, Argentina
Physics Department, United Arab Emirates University, P.O. Box 17551, Al-Ain, United Arab Emirates
National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki 305-8565, Japan
Palabras clave:Cobaltite thin films; Conduction mechanism; Strain engineering; Aluminum compounds; Epitaxial growth; Film thickness; Lanthanum compounds; Magnetism; Organometallics; Strontium titanates; Substrates; Titanium compounds; X ray diffraction; Conduction Mechanism; Degree of localization; Electrical and magnetic property; Metal organic deposition; Raman spectroscopy measurements; Strain engineering; Structural and physical properties; Variable-range hopping conduction; Thin films
Año:2014
Volumen:306
Página de inicio:60
Página de fin:65
DOI: http://dx.doi.org/10.1016/j.apsusc.2014.03.034
Título revista:Applied Surface Science
Título revista abreviado:Appl Surf Sci
ISSN:01694332
CODEN:ASUSE
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_01694332_v306_n_p60_Othmen

Referencias:

  • Mizusaki, J., Tabuchi, J., Matsuura, T., Yamauchi, S., Fueki, K., (1989) J. Electrochem. Soc., 136, p. 2082
  • Ohno, Y., Nagata, S., Sato, H., (1983) Solid State Ion., 9, p. 1001
  • Maignan, A., Hebert, S., Pi, L., Pelloquin, D., Martin, C., Michel, C., Hervieu, M., Raveau, B., (2002) Crystal Eng., 5, p. 365
  • Aarbogh, H.M., Wu, J., Wang, L., Zheng, H., Mitchell, J.F., Leighton, C., (2006) Phys. Rev. B, 74, p. 134408
  • Torija, M.A., Sharma, M., Fitzsimmons, M.R., Varela, M., Leighton, C., (2008) J. Appl. Phys., 104, p. 023901
  • Rata, A.D., Herklotz, A., Nenkov, K., Schultz, L., Dorr, K., (2008) Phys. Rev. Lett., 100, p. 076401
  • Malavasi, L., Quartarone, E., Sanna, C., Lampis, N., Lehmann, A.G., Tealdi, C., Mozzati, M.C., Flor, G., (2006) Chem. Mater., 18, p. 5230
  • Fuchs, D., Moran, O., Adelmann, P., Schneider, R., (2004) Physica B, 349, p. 337
  • Fuchs, D., Schwarz, T., Moran, O., Schweiss, P., Schneider, R., (2005) Phys. Rev. B, 71, p. 092406
  • Sun, J.R., Yeung, H.W., Li, H., Zhao, K., Chan, H.N., Wong, H.K., (2001) J. Appl. Phys., 90, p. 2831
  • Daoudi, K., Tsuchiya, T., Nakajima, T., Fouzri, A., Oueslati, M., (2010) J. Alloys Compd., 506, p. 483
  • Caciuffo, R., Rinaldi, D., Barucca, G., Mira, J., Rivas, J., Senaris-Rodriguez, M.A., Radaelli, P.G., Goodenough, J.B., (1999) Phys. Rev. B, 59, p. 1068
  • Abrashev, M.V., Litvinchuk, A.P., Iliev, M.N., Meng, R.L., Popov, V.N., Ivanov, V.G., Chakalov, R.A., Thomsen, C., (1999) Phys. Rev. B, 59, p. 4146
  • Suda, J., Kamishima, O., Kawamura, J., Hattori, T., Sato, T., (2009) J. Phys: Conf. Ser., 150, p. 052249
  • Ishikawa, A., Nohara, J., Sugai, S., (2004) Phys. Rev. Lett., 93, p. 136401
  • Orlovskaya, N., Stenmetz, D., Yarmolenko, S., Pai, D., Sankar, J., Goodenough, J., (2005) Phys. Rev. B, 72, p. 014122
  • Xiong, Y.M., Chen, T., Wang, G.Y., Chen, X.H., Chen, X., Chen, C.L., (2004) Phys. Rev. B, 70, p. 094407
  • Mott, N.F., (1990) Metal-Insulator Transitions, , 2nd ed. Taylor and Francis London
  • Imada, M., Fujimori, A., Tokura, Y., (1998) Rev. Mod. Phys., 70, p. 1039
  • Kriener, M., Zobel, C., Reichl, A., Baier, J., Cwik, M., Berggold, K., Kierspel, H., Lorenz, T., (2004) Phys. Rev. B, 69, p. 094417
  • Itoh, M., Natori, I., Kubota, S., Motoya, K., (1994) J. Phys. Soc. Jpn., 63, p. 1486
  • Kuhns, P.L., Hoch, M.J.R., Moulton, W.G., Reyes, A.P., Wu, J., Leighton, C., (2003) Phys. Rev. Lett., 91, p. 127202

Citas:

---------- APA ----------
Othmen, Z., Schulman, A., Daoudi, K., Boudard, M., Acha, C., Roussel, H., Oueslati, M.,..., Tsuchiya, T. (2014) . Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates. Applied Surface Science, 306, 60-65.
http://dx.doi.org/10.1016/j.apsusc.2014.03.034
---------- CHICAGO ----------
Othmen, Z., Schulman, A., Daoudi, K., Boudard, M., Acha, C., Roussel, H., et al. "Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates" . Applied Surface Science 306 (2014) : 60-65.
http://dx.doi.org/10.1016/j.apsusc.2014.03.034
---------- MLA ----------
Othmen, Z., Schulman, A., Daoudi, K., Boudard, M., Acha, C., Roussel, H., et al. "Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates" . Applied Surface Science, vol. 306, 2014, pp. 60-65.
http://dx.doi.org/10.1016/j.apsusc.2014.03.034
---------- VANCOUVER ----------
Othmen, Z., Schulman, A., Daoudi, K., Boudard, M., Acha, C., Roussel, H., et al. Structural, electrical and magnetic properties of epitaxial La 0.7 Sr 0.3 CoO 3 thin films grown on SrTiO 3 and LaAlO 3 substrates. Appl Surf Sci. 2014;306:60-65.
http://dx.doi.org/10.1016/j.apsusc.2014.03.034