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Abstract:

This work describes the dielectric properties of piezoelectric poly(vinylidene fluoride) (PVDF) thin films in the frequency and temperature ranges relevant for usual applications. We measured the isothermal dielectric relaxation spectra of commercial piezoelectric PVDF thin films between 10 Hz to 10 MHz, at several temperatures from 278 K to 308 K. Measurements were made for samples in mechanically free and clamped conditions, in the direction of the poling field (perpendicular to the film). We found that the imaginary part of the dielectric relaxation spectra of free and clamped PVDF samples is dominated by a peak, above 100 kHz, that can be characterized by a Havriliak-Negami function. The characteristic time follows an Arrhenius dependence on temperature. Moreover, the spectra of the free PVDF samples show two additional peaks at low frequencies which are associated with mechanical relaxation processes. Our results are important for the characterization of piezoelectric PVDF, particularly after the stretching and poling processes in thin films, and for the design and characterization of a broad range of ultrasonic transducers. © 2013 Elsevier Ltd. All rights reserved.

Registro:

Documento: Artículo
Título:Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K
Autor:Ciocci Brazzano, L.; Sorichetti, P.A.; Santiago, G.D.; González, M.G.
Filiación:Grupo de Láser, Óptica de Materiales y Aplicaciones Electromagnéticas (GLOMAE), Universidad de Buenos Aires, Paseo Colón 850, C1063ACV Buenos Aires, Argentina
Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET), Argentina
Grupo de Sistemas Dispersos-Laboratorio de Sistemas Líquidos (GSD-LSL), Departamento de Física, Universidad de Buenos Aires, Paseo Colón 850, C1063ACV Buenos Aires, Argentina
Palabras clave:Broadband dielectric spectroscopy; Clamped piezoelectric; Medical imaging; Piezoelectric thin films; Poly(vinylidene fluoride) PVDF; Ultrasonic transducers; Arrhenius dependence; Broad-band dielectric spectroscopy; Clamped piezoelectric; Dielectric characterization; Dielectric relaxation spectra; Piezoelectric thin films; Poly (vinylidene fluoride)(PVDF); Poly(vinylidene fluoride); Characterization; Dielectric relaxation; Medical imaging; Thin films; Transducers; Ultrasonic transducers; Piezoelectricity
Año:2013
Volumen:32
Número:7
Página de inicio:1186
Página de fin:1191
DOI: http://dx.doi.org/10.1016/j.polymertesting.2013.07.004
Título revista:Polymer Testing
Título revista abreviado:Polym Test
ISSN:01429418
CODEN:POTED
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_01429418_v32_n7_p1186_CiocciBrazzano

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Citas:

---------- APA ----------
Ciocci Brazzano, L., Sorichetti, P.A., Santiago, G.D. & González, M.G. (2013) . Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K. Polymer Testing, 32(7), 1186-1191.
http://dx.doi.org/10.1016/j.polymertesting.2013.07.004
---------- CHICAGO ----------
Ciocci Brazzano, L., Sorichetti, P.A., Santiago, G.D., González, M.G. "Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K" . Polymer Testing 32, no. 7 (2013) : 1186-1191.
http://dx.doi.org/10.1016/j.polymertesting.2013.07.004
---------- MLA ----------
Ciocci Brazzano, L., Sorichetti, P.A., Santiago, G.D., González, M.G. "Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K" . Polymer Testing, vol. 32, no. 7, 2013, pp. 1186-1191.
http://dx.doi.org/10.1016/j.polymertesting.2013.07.004
---------- VANCOUVER ----------
Ciocci Brazzano, L., Sorichetti, P.A., Santiago, G.D., González, M.G. Broadband dielectric characterization of piezoelectric poly(vinylidene fluoride)thin films between 278 K and 308 K. Polym Test. 2013;32(7):1186-1191.
http://dx.doi.org/10.1016/j.polymertesting.2013.07.004