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Abstract:

The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N2 pressure is reported. A Faraday Cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scattering of the ions was taken into account. It has been possible to register the ion energy up to a lower kinetic energy threshold of 50 keV, which is a value much lower than that obtained with a Thomson spectrometer in a previous work. © 1998 IEEE.

Registro:

Documento: Artículo
Título:Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode
Autor:Kelly, H.; Lepone, A.; Marquez, A.; Sadowski, M.J.; Baranowski, J.; Skladnik-Sadowska, E.
Filiación:Institute de fi'Sica Del Plasma, Departmento de fi'Sica, Ciudad Universitaria, Pab I, 1428, Buenos Aires, Argentina
Soltan Institute for Nuclear Studies, 05-400 Otwock-Swierk, Poland
Palabras clave:Faraday cup diagnostic; Ion beams; Ion energy spectral analysis; Plasma focus; Electron emission; Ion beams; Nitrogen; Plasma diagnostics; Spectrum analysis; Faraday cup diagnostics; Plasma focus (PF) devices; Plasma devices
Año:1998
Volumen:26
Número:1
Página de inicio:113
Página de fin:117
DOI: http://dx.doi.org/10.1109/27.659540
Título revista:IEEE Transactions on Plasma Science
Título revista abreviado:IEEE Trans Plasma Sci
ISSN:00933813
CODEN:ITPSB
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00933813_v26_n1_p113_Kelly

Referencias:

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  • Baranowski, J., M. Sadowski, E. Skladnik-Sadowska, J. Zebroski, H. Kelly, A. Lepone, and A. Marquez, "Time Resolved Measurements of Deuterium and Nitrogen Ions from Different Plasma Devices," in Proc Int. Symp. Plasma '97, Res. Appl. Plasmas, Jarnoltowek-Opole, Poland, M. Sadowski and H. Rothkaehl, Eds., Vol., , 1 (contributed papers), pp. 433-436, 1997
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Citas:

---------- APA ----------
Kelly, H., Lepone, A., Marquez, A., Sadowski, M.J., Baranowski, J. & Skladnik-Sadowska, E. (1998) . Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode. IEEE Transactions on Plasma Science, 26(1), 113-117.
http://dx.doi.org/10.1109/27.659540
---------- CHICAGO ----------
Kelly, H., Lepone, A., Marquez, A., Sadowski, M.J., Baranowski, J., Skladnik-Sadowska, E. "Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode" . IEEE Transactions on Plasma Science 26, no. 1 (1998) : 113-117.
http://dx.doi.org/10.1109/27.659540
---------- MLA ----------
Kelly, H., Lepone, A., Marquez, A., Sadowski, M.J., Baranowski, J., Skladnik-Sadowska, E. "Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode" . IEEE Transactions on Plasma Science, vol. 26, no. 1, 1998, pp. 113-117.
http://dx.doi.org/10.1109/27.659540
---------- VANCOUVER ----------
Kelly, H., Lepone, A., Marquez, A., Sadowski, M.J., Baranowski, J., Skladnik-Sadowska, E. Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a faraday cup operating in the secondary electron emission mode. IEEE Trans Plasma Sci. 1998;26(1):113-117.
http://dx.doi.org/10.1109/27.659540