Navegar

Colección

Datos Estadísticas

Artículo

Estamos trabajando para incorporar este artículo al repositorio
Consulte el artículo en la página del editor
Consulte la política de Acceso Abierto del editor

Abstract:

An innovative focus error detection method is presented that is only sensitive to surface curvature variations, canceling both thermoreflectance and photodefelection effects. The detection scheme consists of an astigmatic probe laser and a four-quadrant detector. Nonlinear curve fitting of the defocusing signal allows the retrieval of a cutoff frequency, which only depends on the thermal diffusivity of the sample and the pump beam size. Therefore, a straightforward retrieval of the thermal diffusivity of the sample is possible with microscopic lateral resolution and high axial resolution (∼100 pm). © 2013 American Institute of Physics.

Registro:

Documento: Artículo
Título:Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)
Autor:Domené, E.A.; Martínez, O.E.
Filiación:Laboratorio de Electrónica Cuántica (LEC), Departamento de Física, Universidad de Buenos Aires (UBA), Buenos Aires, Argentina
Tolket SRL, Int. Güiraldes 2160, CABA C1428EAH, Buenos Aires, Argentina
Palabras clave:Axial resolutions; Defocusing; Detection device; Detection methods; Detection scheme; Four-quadrant; Lateral resolution; Nonlinear curve fitting; Probe laser; Pump beams; Surface curvatures; Thermoreflectance; Curve fitting; Cutoff frequency; Thermal expansion
Año:2013
Volumen:84
Número:1
DOI: http://dx.doi.org/10.1063/1.4774111
Título revista:Review of Scientific Instruments
Título revista abreviado:Rev. Sci. Instrum.
ISSN:00346748
CODEN:RSINA
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00346748_v84_n1_p_Domene

Referencias:

  • Ma, T.C., Munidasa, M., Mandelis, A., (1992) J. Appl. Phys, 71, p. 6029. , 10.1063/1.350459
  • Munidasa, M., Funak, F., Mandelis, A., (1998) J. Appl. Phys, 83, p. 3495. , 10.1063/1.366562
  • Celorrio, R., Apiñaniz, E., Mendioroz, A., Salazar, A., Mandelis, A., (2010) J. Appl. Phys, 107, p. 083519. , 10.1063/1.3357378
  • Glorieux, C., Li Voti, R., Thoen, J., Bertolotti, M., Sibilia, C., (1999) J. Appl. Phys, 85, p. 7059. , 10.1063/1.370512
  • Bisson, J.F., Fournier, D., (1998) High Temp. - High Press, 30, p. 205. , 10.1068/htec547
  • Bincheng, L., Roger, J.P., Pottier, L., Fournier, D., (1999) J. Appl. Phys, 86, p. 5314. , 10.1063/1.371520
  • Fournier, D., (2001) MRS Bull, 26, p. 465. , 10.1557/mrs2001.117
  • Rochais, D., Le Houëdec, H., Enguehard, F., Jumel, J., Lepoutre, F., (2005) J. Phys. D: Appl. Phys, 38, p. 1498. , 10.1088/0022-3727/38/10/002
  • Martínez, O.E., Balzarotti, F., Mingolo, N., (2008) Appl. Phys. B, 90, pp. 69-77. , 10.1007/s00340-007-2847-8
  • Crossa Archiopoli, U., Mingolo, N., Martínez, O.E., (2010) J. Appl. Phys, 107, p. 023520. , 10.1063/1.3289218
  • Crossa Archiopoli, U., Mingolo, N., Martínez, O.E., (2011) Surf. Coat. Technol, 205, p. 3087. , 10.1016/j.surfcoat.2010.11.022
  • Mingolo, N., Martínez, O.E., (2012) J. Appl. Phys, 111, p. 123526. , 10.1063/1.4730636
  • Opsal, J., Rosencwaig, A., Willenborg, D.L., (1983) Appl. Opt, 22, pp. 3169-3176. , 10.1364/AO.22.003169
  • Jackson, W.B., Amer, N.M., Boccara, A.C., Fournier, D., (1981) Appl. Opt, 20, pp. 1333-1344. , 10.1364/AO.20.001333
  • Landi, S.M., Bragas, A.V., Coy, J.A., Martínez, O.E., (1999) Ultramicroscopy, 77, pp. 207-211. , 10.1016/S0304-3991(99)00038-8
  • Fan, K., Chu, C., Mou, J., (2001) Meas. Sci. Technol, 12, p. 2137. , 10.1088/0957-0233/12/12/315
  • Opsal, J., Taylor, M.W., Smith, L., Rosencwaig, A., (1987) J. Appl. Phys, 61, p. 240. , 10.1063/1.338863
  • Chambouleyron, I., Martínez, J.M., Moretti, A.C., Mulato, M., (1997) Appl. Opt, 36, pp. 8238-8247. , 10.1364/AO.36.008238
  • Goddard, L., Wong, K., Garg, A., Behymer, E., Cole, G., Bond, T., (2008) Proceedings of the IEEE LEOS Annual Meeting, pp. 569-570. , in (IEEE)
  • Domené, E.A., Balzarotti, F., Bragas, A.V., Martínez, O.E., (2009) Opt. Lett, 34, pp. 3797-3799. , 10.1364/OL.34.003797
  • http://www.lookchem.com/Periodic-Table/Bismuth/, See for uses, characteristics and properties of elements in the periodic table

Citas:

---------- APA ----------
Domené, E.A. & Martínez, O.E. (2013) . Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM). Review of Scientific Instruments, 84(1).
http://dx.doi.org/10.1063/1.4774111
---------- CHICAGO ----------
Domené, E.A., Martínez, O.E. "Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)" . Review of Scientific Instruments 84, no. 1 (2013).
http://dx.doi.org/10.1063/1.4774111
---------- MLA ----------
Domené, E.A., Martínez, O.E. "Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM)" . Review of Scientific Instruments, vol. 84, no. 1, 2013.
http://dx.doi.org/10.1063/1.4774111
---------- VANCOUVER ----------
Domené, E.A., Martínez, O.E. Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM). Rev. Sci. Instrum. 2013;84(1).
http://dx.doi.org/10.1063/1.4774111