Artículo
Abstract:
Considering an interface between two uniaxial birefringent crystals, four reflected and four refracted waves for each incidence direction are obtained. Along this direction can propagate an ordinary wave and an extraordinary wave. Here, we present the analytic expressions for the four critical angles, from which each refracted wave no more exists as propagating wave. We show the variation in these critical angles for different interfaces varying the orientation of the incidence plane with respect to the optical axes. When both principal refractive indices of the second medium are smaller than those of the first medium, then the four critical angles exist for each incidence plane and for any direction of the optical axes. But, when one of the indices has an intermediate value between the values of the indices of the other crystal, we can chose the optical axes directions in such a way that certain critical angles do not exist. Therefore, we can select the refracted wave that is eliminated by total reflection. © 2005 Elsevier GmbH. All rights reserved.
Registro:
| Documento: | Artículo |
| Título: | Total reflection in a uniaxial crystal-uniaxial crystal interface |
| Autor: | Simon, M.C.; Bastida, K.B.; Gottschalk, K.V. |
| Filiación: | Departamento de Física, Laboratorio de Optica, Ciudad Universitaria -Pabellón I, (1428) Buenos Aires, Argentina |
| Palabras clave: | Birefringence; Critical angle; Total reflection; Crystals; Light propagation; Refraction; Critical angles; Optical axes; Refracted waves; Light reflection |
| Año: | 2005 |
| Volumen: | 116 |
| Número: | 12 |
| Página de inicio: | 586 |
| Página de fin: | 594 |
| DOI: | http://dx.doi.org/10.1016/j.ijleo.2005.04.008 |
| Título revista: | Optik |
| Título revista abreviado: | Optik |
| ISSN: | 00304026 |
| Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v116_n12_p586_Simon |
Referencias:
- Stavroudis, O.N., Ray-tracing formulas for uniaxial crystals (1962) J. Opt. Soc. Am., 52, pp. 187-191
- Swindell, W., Extraordinary ray and wave-tracing in uniaxial crystals (1975) Appl. Opt., 14, pp. 2298-2301
- Simon, M.C., Echarri, R.M., Ray tracing formulas for monoaxial optical comonents: Vectorial formulation (1986) Appl. Opt., 25, pp. 1935-1939
- Trolinger, J.D., Chipman, A., Wilson, D.K., Polarization ray tracing in birefringent media (1991) Opt. Eng., 30, pp. 461-466
- Simon, M.C., Echarri, R.M., Internal reflection in uniaxial crystals I. Geometrical description (1990) J. Mod. Opt., 37, pp. 121-129
- Simon, M.C., Perez, L.I., Total reflection in uniaxial crystals (1989) Optik, 82, pp. 37-42
- Simon, M.C., Díaz, I., Total reflection in biaxial crystals: Calculation of the limiting angle for incidence from an isotropic medium (1996) Optik, 102, pp. 1-8
- Simon, M.C., Echarri, R.M., Internal total reflection in monoaxial crystals (1987) Appl. Opt., 26, pp. 3878-3883
- Simon, M.C., Echarri, R.M., Inhibited reflection in uniaxial crystals (1989) Opt. Lett., 14, pp. 257-259
Citas:
---------- APA ----------
Simon, M.C., Bastida, K.B. & Gottschalk, K.V. (2005) . Total reflection in a uniaxial crystal-uniaxial crystal interface. Optik, 116(12), 586-594.http://dx.doi.org/10.1016/j.ijleo.2005.04.008
---------- CHICAGO ----------
Simon, M.C., Bastida, K.B., Gottschalk, K.V. "Total reflection in a uniaxial crystal-uniaxial crystal interface" . Optik 116, no. 12 (2005) : 586-594.http://dx.doi.org/10.1016/j.ijleo.2005.04.008
---------- MLA ----------
Simon, M.C., Bastida, K.B., Gottschalk, K.V. "Total reflection in a uniaxial crystal-uniaxial crystal interface" . Optik, vol. 116, no. 12, 2005, pp. 586-594.http://dx.doi.org/10.1016/j.ijleo.2005.04.008
---------- VANCOUVER ----------
Simon, M.C., Bastida, K.B., Gottschalk, K.V. Total reflection in a uniaxial crystal-uniaxial crystal interface. Optik. 2005;116(12):586-594.http://dx.doi.org/10.1016/j.ijleo.2005.04.008
