Artículo
Simon, J.M.; Echarri, R.; Walsh, P.A. "Multilocalization of interference fringes in the Mach-Zender interferometer" (2000) Optik (Jena). 111(7):307-309
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Abstract:
The phenomenon of multiple localization in a Mach-Zender interferometer illuminated by a system of incoherent equidistant linear sources is studied. The relation between multilocalization and diffraction at a grating of period equal to the spacing between the sources composing the illumination system is analyzed. Using the former relation an adjustment method is developed for interferometers of separated beams. This method enables the interference fringes at the different focalization planes to be seen without readjusting the alignment. This enables to observe perturbations at different planes with the simple focalization of the camera.
Registro:
| Documento: | Artículo |
| Título: | Multilocalization of interference fringes in the Mach-Zender interferometer |
| Autor: | Simon, J.M.; Echarri, R.; Walsh, P.A. |
| Ciudad: | Stuttgart, Germany |
| Filiación: | Laboratorio de Optica, Departamento de Física, Ciudad Universitaria, Pabellón I, (1428) Buenos Aires, Argentina |
| Palabras clave: | Cameras; Diffraction gratings; Light interference; Perturbation techniques; Interference fringes; Mach-Zender interferometers; Interferometers |
| Año: | 2000 |
| Volumen: | 111 |
| Número: | 7 |
| Página de inicio: | 307 |
| Página de fin: | 309 |
| Título revista: | Optik (Jena) |
| Título revista abreviado: | Optik (Jena) |
| ISSN: | 00304026 |
| CODEN: | OTIKA |
| Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v111_n7_p307_Simon |
Referencias:
- Simon, J.M., Simon, M.C., Echarri, R., Garea, M.T., Fringe localization in interferometers illuminated by a succession of incoherent line sources (1998) J. Mod. Opt., 45, pp. 2245-2254
- Simon, J.M., Iemmi, C.C., Method of adjusting an interferometer (1990) Appl. Opt., 29, pp. 3569-3570
Citas:
---------- APA ----------
Simon, J.M., Echarri, R. & Walsh, P.A. (2000) . Multilocalization of interference fringes in the Mach-Zender interferometer. Optik (Jena), 111(7), 307-309.Recuperado de https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v111_n7_p307_Simon [ ]
---------- CHICAGO ----------
Simon, J.M., Echarri, R., Walsh, P.A. "Multilocalization of interference fringes in the Mach-Zender interferometer" . Optik (Jena) 111, no. 7 (2000) : 307-309.Recuperado de https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v111_n7_p307_Simon [ ]
---------- MLA ----------
Simon, J.M., Echarri, R., Walsh, P.A. "Multilocalization of interference fringes in the Mach-Zender interferometer" . Optik (Jena), vol. 111, no. 7, 2000, pp. 307-309.Recuperado de https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v111_n7_p307_Simon [ ]
---------- VANCOUVER ----------
Simon, J.M., Echarri, R., Walsh, P.A. Multilocalization of interference fringes in the Mach-Zender interferometer. Optik (Jena). 2000;111(7):307-309.Available from: https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v111_n7_p307_Simon [ ]
