Artículo
Simon, M.C.; Díaz, I. "Total reflection in biaxial crystals: Calculation of the limiting angle for incidence from an isotropic medium" (1996) Optik (Jena). 102(1):1-8
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Abstract:
The limiting angles for total reflection depend on the characteristics of the discontinuity surface (isotropic medium - biaxial crystal) and on the orientation of the principal axes refered to the incidence plane. In this paper a detailed description of this variation for different ways of cutting the crystal and different values of the refraction index of the isotropic medium is presented. Different situations in which, for the same interface, the total reflection condition is verified for certain incidence planes and is not verified for other are shown.
Registro:
| Documento: | Artículo |
| Título: | Total reflection in biaxial crystals: Calculation of the limiting angle for incidence from an isotropic medium |
| Autor: | Simon, M.C.; Díaz, I. |
| Filiación: | Laboratorio de Optica, Departamento de Física, Universidad de Buenos Aires, Argentina Cátedra de Física, Departamento V, Universidad de Buenos Aires, Argentina Laboratorio de Optica, Departamento de Física, Pabellón I, 1428 Buenos Aires, Argentina Cátedra de Física, Departamento V, Pabellón III, 1428 Buenos Aires, Argentina |
| Palabras clave: | Calculations; Crystal cutting; Crystals; Dielectric materials; Magnetic anisotropy; Magnetic permeability; Maxwell equations; Permittivity; Refractive index; Surfaces; Tensors; Vectors; Biaxial crystals; Dielectric anisotropy; Magnetic induction; Light reflection |
| Año: | 1996 |
| Volumen: | 102 |
| Número: | 1 |
| Página de inicio: | 1 |
| Página de fin: | 8 |
| Título revista: | Optik (Jena) |
| Título revista abreviado: | Optik (Jena) |
| ISSN: | 00304026 |
| CODEN: | OTIKA |
| Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v102_n1_p1_Simon |
Referencias:
- Stavroudis, O.N., Ray-tracing formulas for uniaxial crystals (1962) J. Opt. Soc. Am., 52, p. 187
- Swindell, W., Extraordinary ray and wave-tracing in uniaxial crystals (1975) Appl. Opt., 14, p. 2298
- Simon, M.C., Ray tracing formulas for monoaxial optical components (1983) Appl. Opt., 22, pp. 354-360
- Simon, M.C., Echarri, R.M., Ray tracing formulas for monoaxial components: Vectorial formulation (1986) Appl. Opt., 25, pp. 1935-1939
- Simon, M.C., Refraction in biaxial crystals: A formula for the indices (1987) J. Opt. Soc. Am., A4, pp. 2201-2204
- Simon, M.C., Ray tracing in monoaxial crystals; are the exact formulas necessary (1987) Appl. Opt., 26, pp. 3187-3189
- Zhang, W.-Q., General ray-tracing formulas for crystals (1992) Appl. Opt., 31, pp. 7328-7331
- Brehate, F., Wyncke, B., Calculation of the refractive indices and direction of refracted rays as functions of the angle of incidence, in uniaxial and biaxial crystals (1993) J. Phys. D. Appl. Phys., 26, pp. 793-801
- Simon, M.C., Wollaston prism with large split angle (1986) Appl. Opt., 25, pp. 369-376
- Simon, M.C., Echarri, R.M., Image formation through monoaxial plane-parallel plates (1987) Appl. Opt., 26, pp. 3878-3883
- Simon, M.C., Aberrations of a horizontal-vertical depolarizer (1988) Appl. Opt., 27, p. 4716
- McClain, S.C., Chipman, R.A., Hillman, I.W., Internal total reflection in monoaxial crystals (1992) Appl. Opt., 31, pp. 2326-2331
- Lakhtakia, A., Varadan, V.K., Varadan, V.V., Reflection and transmission of plane waves at the planar interface of a general uniaxial medium and free space (1991) J. Mod. Opt., 38, p. 649
- Simon, M.C., Farias, D., Reflection and refraction in uniaxial crystals with dielectric and magnetic anisotropy (1994) J. Mod. Opt., 41, pp. 413-429
- Simon, M.C., Perez, L.I., Total reflection in uniaxial crystals (1989) Optik, 82, pp. 37-42
Citas:
---------- APA ----------
Simon, M.C. & Díaz, I. (1996) . Total reflection in biaxial crystals: Calculation of the limiting angle for incidence from an isotropic medium. Optik (Jena), 102(1), 1-8.Recuperado de https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v102_n1_p1_Simon [ ]
---------- CHICAGO ----------
Simon, M.C., Díaz, I. "Total reflection in biaxial crystals: Calculation of the limiting angle for incidence from an isotropic medium" . Optik (Jena) 102, no. 1 (1996) : 1-8.Recuperado de https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v102_n1_p1_Simon [ ]
---------- MLA ----------
Simon, M.C., Díaz, I. "Total reflection in biaxial crystals: Calculation of the limiting angle for incidence from an isotropic medium" . Optik (Jena), vol. 102, no. 1, 1996, pp. 1-8.Recuperado de https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v102_n1_p1_Simon [ ]
---------- VANCOUVER ----------
Simon, M.C., Díaz, I. Total reflection in biaxial crystals: Calculation of the limiting angle for incidence from an isotropic medium. Optik (Jena). 1996;102(1):1-8.Available from: https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00304026_v102_n1_p1_Simon [ ]
