A generalization of the plate diagram is given which permits the calculation of the aberrations of off-axis systems, taking into account anamorphosis due to the grating. It is preferable to work with the deformations of the wavefront rather than Seidel coefficients because in this way anamorphosis can be treated in a simple form. As examples, the aberrations of the Ebert and the Czerny–Turner spectrographs are calculated. © 1973 Taylor & Francis Group, LLC.
Documento: | Artículo |
Título: | The plate diagram and its application to off axis systems and spectrographs |
Autor: | Simon, J.M. |
Filiación: | Departamento de Física, Universidad de Buenos Aires, Argentina |
Año: | 1973 |
Volumen: | 20 |
Número: | 5 |
Página de inicio: | 345 |
Página de fin: | 352 |
DOI: | http://dx.doi.org/10.1080/713818782 |
Título revista: | Optica Acta |
Título revista abreviado: | Opt. Acta |
ISSN: | 00303909 |
Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00303909_v20_n5_p345_Simon |