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Rodríguez-Trelles, F.; Caputo, M.C. "X-ray film spectroscopy" (1982) Nuclear Instruments and Methods. 193(1-2):115-119
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Abstract:

A multi-pinhole camera using film as a detector is described. Separation of variables in the master-curve sense leads to integral exposure equations which are solved by regularization. A filter-selection method is used to maximize the information content of a given set of measurements. Numerical simulation examples of the unfolding procedure are shown and the inversion error is evaluated. The essential role of absorption edges of filters and detectors for increasing the information content is emphasized and the method is compared with other absorption-edge techniques. A discussion of the present limitations of the method is given. © 1982.

Registro:

Documento: Artículo
Título:X-ray film spectroscopy
Autor:Rodríguez-Trelles, F.; Caputo, M.C.
Filiación:Laboratorio de Física del Plasma, Facultad de Ciencias Exactas y Naturales (Univ. Buenos Aires), Argentina
DIGID (Ministerio de Defensa), Pabellon 1 - Ciudad Universitaria, 1428 Buenos Aires, Argentina
Año:1982
Volumen:193
Número:1-2
Página de inicio:115
Página de fin:119
DOI: http://dx.doi.org/10.1016/0029-554X(82)90684-X
Título revista:Nuclear Instruments and Methods
ISSN:0029554X
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_0029554X_v193_n1-2_p115_RodriguezTrelles

Referencias:

  • Bostick, Proc. Int. Conf. on ES and EM confinement plasmas and relativistic electron beams (1974) N.Y. Acad. Sci.
  • Rodríguez-Trelles, (1975) Ph.D. Thesis, , Univ. Bs. Aires
  • Caputo, (1980) M.S. Thesis, , FCEN-UBA
  • Dozier, (1976) J. Appl. Phys., 47, p. 3732
  • Dozier, (1967) Applied Optics, 6, p. 2136
  • Veigele, (1973) At. Data, 5, p. 51
  • M.C. Caputo and F. Rodríguez-Trelles, LFP-DIGID P-p:2/81; Twomey, (1974) Appl. Optics, 13, p. 942
  • F. Rodríguez-Trelles and M.C. Caputo, LFP-DIGID P-p:1/81; Phillips, (1962) Journal of the ACM, 9, p. 84
  • Pavlovskii, (1976) Instr. Exp. Tech., 19, p. 862
  • Strand, Westwater, (1968) Journal of the ACM, 15, p. 100
  • Ross, (1928) Journal of the Optical Society of America, 16, p. 433
  • Johnson, (1974) Rev. Sci. Instr., 45, p. 191
  • Slivinsky, Kornblum, (1973) Bull. Am. Phys. Soc., 18, p. 1256
  • Brown, (1976) J. Appl. Phys., 47, p. 3722

Citas:

---------- APA ----------
Rodríguez-Trelles, F. & Caputo, M.C. (1982) . X-ray film spectroscopy. Nuclear Instruments and Methods, 193(1-2), 115-119.
http://dx.doi.org/10.1016/0029-554X(82)90684-X
---------- CHICAGO ----------
Rodríguez-Trelles, F., Caputo, M.C. "X-ray film spectroscopy" . Nuclear Instruments and Methods 193, no. 1-2 (1982) : 115-119.
http://dx.doi.org/10.1016/0029-554X(82)90684-X
---------- MLA ----------
Rodríguez-Trelles, F., Caputo, M.C. "X-ray film spectroscopy" . Nuclear Instruments and Methods, vol. 193, no. 1-2, 1982, pp. 115-119.
http://dx.doi.org/10.1016/0029-554X(82)90684-X
---------- VANCOUVER ----------
Rodríguez-Trelles, F., Caputo, M.C. X-ray film spectroscopy. 1982;193(1-2):115-119.
http://dx.doi.org/10.1016/0029-554X(82)90684-X