Excess dielectric properties for CCl4 + benzene, CCl4 + toluene, and CCl4 + p-xylene were calculated from permittivity and refractive index measurements, over the whole range of concentrations, at 298.15 and 308.15 K. To describe the excess dielectric properties a simple model is used that is based on the additivity of electrical susceptibilities and on the formation of a complex between the components. Since the equilibrium constant for the complex formation is known, the dipole moment of these complexes in solution could be calculated. © 1988 American Chemical Society.
Documento: | Artículo |
Título: | Dielectric properties of binary systems. 7. Carbon tetrachloride with benzene, with toluene, and with p-xylene at 298.15 and 308.15 K |
Autor: | Buep, A.H.; Barón, M. |
Filiación: | Departamento de Física, Facultad de Ciencias Exactas y Naturales, Universitaria, 1428-Buenos Aires, Argentina Carrera del Investigador, Consejo de Investigaciones Científicas y Técnicas |
Idioma: | Inglés |
Palabras clave: | BENZENE - Dielectric Properties; TOLUENE - Dielectric Properties; XYLENE - Dielectric Properties; DIPOLE MOMENT; ELECTRICAL SUSCEPTIBILITIES; ELECTRON CLOUDS; MOLAR POLARIZATION; REFRACTIVE INDEX MEASUREMENTS; CARBON TETRACHLORIDE |
Año: | 1988 |
Volumen: | 92 |
Número: | 3 |
Página de inicio: | 840 |
Página de fin: | 843 |
Título revista: | Journal of Physical Chemistry |
ISSN: | 00223654 |
Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00223654_v92_n3_p840_Buep |