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Abstract:

Changes in the concentration of oxygen vacancies within the grains of polycrystalline SnO2, due to different atmosphere exposures, were detected using impedance and photoemission spectroscopies. From measured capacitance values, variations of the potential barrier widths could be determined. It is shown that under the presence of an oxygen rich atmosphere, at relatively low temperature, the width of intergranular potential barriers increase to the point that grains become completely depleted of carriers. With subsequent exposure to vacuum, capacitance adopts a higher value, indicative of intergranular barriers and quasi-neutral regions at the center of the grains. X-ray and ultraviolet photoemission spectroscopy measurements showed that SnO2 samples treated in oxidizing or reducing environments have similar barrier heights and different work functions. Results are especially relevant in the study of mechanisms responsible for metal oxide gas sensing. © 2014 AIP Publishing LLC.

Registro:

Documento: Artículo
Título:Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies
Autor:Schipani, F.; Ponce, M.A.; Joanni, E.; Williams, F.J.; Aldao, C.M.
Filiación:Institute of Materials Science and Technology (INTEMA), University of Mar Del Plata and National Research Council (CONICET), Juan B. Justo 4302, Mar del Plata, B7608FDQ, Argentina
CTI Renato Archer, Rodovia D. Pedro I (SP-65) Km 143.6, Campinas, São Paulo, CEP: 13069-901, Brazil
Departamento de Quimica Inorganica, Analitica y Quimica Fisica, Facultad de Ciencias Exactas y Naturales, Universidad de Buenos Aires, Pab. 2, piso 3, Buenos Aires, C1428EHA, Argentina
Palabras clave:Capacitance; Freons; Gas sensing electrodes; Oxygen; Photoelectron spectroscopy; Temperature; Textures; Thick films; Atmosphere exposure; Barrier heights; Capacitance values; Low temperatures; Oxygen-rich atmospheres; Potential barriers; Reducing environment; Ultraviolet photoemission spectroscopy; Oxygen vacancies
Año:2014
Volumen:116
Número:19
DOI: http://dx.doi.org/10.1063/1.4902150
Título revista:Journal of Applied Physics
Título revista abreviado:J Appl Phys
ISSN:00218979
CODEN:JAPIA
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00218979_v116_n19_p_Schipani

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Citas:

---------- APA ----------
Schipani, F., Ponce, M.A., Joanni, E., Williams, F.J. & Aldao, C.M. (2014) . Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies. Journal of Applied Physics, 116(19).
http://dx.doi.org/10.1063/1.4902150
---------- CHICAGO ----------
Schipani, F., Ponce, M.A., Joanni, E., Williams, F.J., Aldao, C.M. "Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies" . Journal of Applied Physics 116, no. 19 (2014).
http://dx.doi.org/10.1063/1.4902150
---------- MLA ----------
Schipani, F., Ponce, M.A., Joanni, E., Williams, F.J., Aldao, C.M. "Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies" . Journal of Applied Physics, vol. 116, no. 19, 2014.
http://dx.doi.org/10.1063/1.4902150
---------- VANCOUVER ----------
Schipani, F., Ponce, M.A., Joanni, E., Williams, F.J., Aldao, C.M. Study of the oxygen vacancies changes in SnO2 polycrystalline thick films using impedance and photoemission spectroscopies. J Appl Phys. 2014;116(19).
http://dx.doi.org/10.1063/1.4902150