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Abstract:

Herein we present a detailed analysis of the optical response of artificial opal films realized employing a near-field scanning optical microscope in collection and transmission modes. Near-field patterns measured at the rear surface when a plane wave impinges on the front face are presented with the finding that optical intensity maps present a clear correlation with the periodic arrangement of the outer surface. Calculations based on the vector Korringa-Kohn-Rostoker method reproduce the different profiles experimentally observed as well as the response to the polarization of the incident field. These observations constitute the first experimental confirmation of the collective lattice resonances that give rise to the optical response of these three dimensional periodic structures in the high-energy range. © 2011 American Institute of Physics.

Registro:

Documento: Artículo
Título:Analysis of artificial opals by scanning near field optical microscopy
Autor:Barrio, J.; Lozano, G.; Lamela, J.; Lifante, G.; Dorado, L.A.; Depine, R.A.; Jaque, F.; Míguez, H.
Filiación:Departamento de Física de Materiales, Universidad Autónoma de Madrid, Cantoblanco 28048, Madrid, Spain
Instituto de Ciencia de Materiales de Sevilla (CSIC-US), Avenida Américo Vespucio 48, Isla de La Cartuja, 41092 Sevilla, Spain
Departamento de Física, Facultad de Ciencias Exactas y Naturales, Universidad de Buenos Aires, Argentina
Palabras clave:A-plane; Artificial opals; Experimental confirmation; Front face; High-energy range; Incident fields; Korringa-Kohn-Rostoker method; Lattice resonances; Near-field pattern; Near-field scanning optical microscope; Optical intensities; Optical response; Outer surface; Rear surfaces; Scanning near-field optical microscopy; Three dimensional periodic structure; Transmission mode; Optical correlation; Periodic structures; Silicate minerals; Near field scanning optical microscopy
Año:2011
Volumen:109
Número:8
DOI: http://dx.doi.org/10.1063/1.3573777
Título revista:Journal of Applied Physics
Título revista abreviado:J Appl Phys
ISSN:00218979
CODEN:JAPIA
PDF:https://bibliotecadigital.exactas.uba.ar/download/paper/paper_00218979_v109_n8_p_Barrio.pdf
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00218979_v109_n8_p_Barrio

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Citas:

---------- APA ----------
Barrio, J., Lozano, G., Lamela, J., Lifante, G., Dorado, L.A., Depine, R.A., Jaque, F.,..., Míguez, H. (2011) . Analysis of artificial opals by scanning near field optical microscopy. Journal of Applied Physics, 109(8).
http://dx.doi.org/10.1063/1.3573777
---------- CHICAGO ----------
Barrio, J., Lozano, G., Lamela, J., Lifante, G., Dorado, L.A., Depine, R.A., et al. "Analysis of artificial opals by scanning near field optical microscopy" . Journal of Applied Physics 109, no. 8 (2011).
http://dx.doi.org/10.1063/1.3573777
---------- MLA ----------
Barrio, J., Lozano, G., Lamela, J., Lifante, G., Dorado, L.A., Depine, R.A., et al. "Analysis of artificial opals by scanning near field optical microscopy" . Journal of Applied Physics, vol. 109, no. 8, 2011.
http://dx.doi.org/10.1063/1.3573777
---------- VANCOUVER ----------
Barrio, J., Lozano, G., Lamela, J., Lifante, G., Dorado, L.A., Depine, R.A., et al. Analysis of artificial opals by scanning near field optical microscopy. J Appl Phys. 2011;109(8).
http://dx.doi.org/10.1063/1.3573777