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Abstract:

This work proposes a new measurement technique to extend the dose range of MOS dosimeters. The technique consists on alternating stages of positive oxide charge buildup with stages of radiation induced charge neutralization, maintaining a uniform sensitivity along the whole measurement. The technique was applied with 70 nm MOS dosimeters, extending the dose measurement range from less than a kilogray to more than 675 kGy without showing wear effects. An initial saturation of interface traps creation ensures repeatability in the responses. © 2008 IEEE.

Registro:

Documento: Artículo
Título:Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization
Autor:Faigón, A.; Lipovetzky, J.; Redin, E.; Krusczenski, G.
Filiación:Device Physics Laboratory-Microelectronics, Departamento de Física, Universidad de Buenos Aires, C1063ACV, Buenos Aires, Argentina
CONICET, CP C1033AAJ, Cdad. de Buenos Aires, Argentina
Palabras clave:Dosimetry; Gamma rays; MOS devices; Radiation effects; Dosimetry; Dose measurements; Dose range; Gamma rays; Induced charges; Initial saturation; Interface trapping; Measurement range; Measurement techniques; MOS devices; Positive oxide charge; Radiation effects; Wear effects; Dosimeters
Año:2008
Volumen:55
Número:4
Página de inicio:2141
Página de fin:2147
DOI: http://dx.doi.org/10.1109/TNS.2008.2000767
Título revista:IEEE Transactions on Nuclear Science
Título revista abreviado:IEEE Trans Nucl Sci
ISSN:00189499
CODEN:IETNA
Registro:https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00189499_v55_n4_p2141_Faigon

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Citas:

---------- APA ----------
Faigón, A., Lipovetzky, J., Redin, E. & Krusczenski, G. (2008) . Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization. IEEE Transactions on Nuclear Science, 55(4), 2141-2147.
http://dx.doi.org/10.1109/TNS.2008.2000767
---------- CHICAGO ----------
Faigón, A., Lipovetzky, J., Redin, E., Krusczenski, G. "Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization" . IEEE Transactions on Nuclear Science 55, no. 4 (2008) : 2141-2147.
http://dx.doi.org/10.1109/TNS.2008.2000767
---------- MLA ----------
Faigón, A., Lipovetzky, J., Redin, E., Krusczenski, G. "Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization" . IEEE Transactions on Nuclear Science, vol. 55, no. 4, 2008, pp. 2141-2147.
http://dx.doi.org/10.1109/TNS.2008.2000767
---------- VANCOUVER ----------
Faigón, A., Lipovetzky, J., Redin, E., Krusczenski, G. Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization. IEEE Trans Nucl Sci. 2008;55(4):2141-2147.
http://dx.doi.org/10.1109/TNS.2008.2000767