Abstract:
The space charge layer of chemically deposited CdS film electrodes in different electrolytes was studied by dc surface conductance measurements. The results obtained by this method are compared with those derived from capacitance and modulated transmittance. The values of the flat band potential obtained for 800 nm thick films in 0.1 M Na 2 SO 4 by the three methods are in good agreement. The influence of sulfide concentration in the electrolyte was analyzed, and the limitations of the dc surface conductance technique for films thinner than 200 nm are discussed.
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Citas:
---------- APA ----------
Alcober, C. & Bilmes, S.A.
(1996)
. dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes. Chemical Physics Letters, 256(4-5), 431-437.
http://dx.doi.org/10.1016/0009-2614(96)00421-6---------- CHICAGO ----------
Alcober, C., Bilmes, S.A.
"dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes"
. Chemical Physics Letters 256, no. 4-5
(1996) : 431-437.
http://dx.doi.org/10.1016/0009-2614(96)00421-6---------- MLA ----------
Alcober, C., Bilmes, S.A.
"dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes"
. Chemical Physics Letters, vol. 256, no. 4-5, 1996, pp. 431-437.
http://dx.doi.org/10.1016/0009-2614(96)00421-6---------- VANCOUVER ----------
Alcober, C., Bilmes, S.A. dc surface conductance as a tool for the study of the space charge layer of thin film semiconductor electrodes. Chem. Phys. Lett. 1996;256(4-5):431-437.
http://dx.doi.org/10.1016/0009-2614(96)00421-6