Artículo
Bragas, A.V.; Landi, S.M.; Martínez, O.E. "Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification" (1998) Applied Physics Letters. 72(17):2075-2077
Estamos trabajando para incorporar este artículo al repositorio
Consulte la política de Acceso Abierto del editor
Abstract:
In this letter we report the measurement of the field enhancement at the tip of a scanning tunneling microscope, by means of the detection of the optical rectification current. A field enhancement factor between 1000 and 2000 is obtained for highly oriented pyrolytic graphite and between 300 and 600 for gold. Field enhancement factors found are strongly dependent on the particular tip used. The magnitude of the emitted light at the field enhanced region, calculated from the measured optical voltage, could be easily detected by a simple photodiode. © 1998 American Institute of Physics.
Registro:
| Documento: | Artículo |
| Título: | Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification |
| Autor: | Bragas, A.V.; Landi, S.M.; Martínez, O.E. |
| Filiación: | Laboratorio de Electrónica Cuántica, Departamento de Física, Universidad de Buenos Aires, Pabellón 1, 1428 Buenos Aires, Argentina |
| Palabras clave: | Electric fields; Gold; Graphite; Light emission; Optical variables measurement; Platinum; Scanning tunneling microscopy; Highly oriented pyrolytic graphite; Optical field enhancement; Optical rectification; Optical voltage; Laser optics |
| Año: | 1998 |
| Volumen: | 72 |
| Número: | 17 |
| Página de inicio: | 2075 |
| Página de fin: | 2077 |
| DOI: | http://dx.doi.org/10.1063/1.121280 |
| Título revista: | Applied Physics Letters |
| Título revista abreviado: | Appl Phys Lett |
| ISSN: | 00036951 |
| CODEN: | APPLA |
| Registro: | https://bibliotecadigital.exactas.uba.ar/collection/paper/document/paper_00036951_v72_n17_p2075_Bragas |
Referencias:
- Heinzelmann, H., Pohl, D.W., (1994) Appl. Phys. A: Solids Surf., 59, p. 89
- Pohl, D.W., (1995) Thin Solid Films, 264, p. 250
- Zenhausern, F., O'Boyle, M.P., Wickramashinge, H.K., (1994) Appl. Phys. Lett., 65, p. 1623
- Zenhausern, F., Martin, Y., Wickramashinge, H.K., (1995) Science, 269, p. 1083
- Vo-Dinh, T., (1995) Surface-Enhanced Raman Scattering, Photonics Probes of Surfaces, , edited by P. Halevi Elsevier, Amsterdam
- Denk, W., Pohl, D.W., (1991) J. Vac. Sci. Technol. B, 9, p. 510
- Johansson, P., Monreal, R., Apell, P., (1990) Phys. Rev. B, 42, p. 9210
- Völcker, M., Krieger, W., Walther, H., (1994) J. Vac. Sci. Technol. B, 12, p. 2129
- Völcker, M., Krieger, W., Walther, H., (1991) AIP Conf. Proc., 241, p. 51
- Bragas, A.V., Landi, S.M., Coy, J.A., Martínez, O.E., (1997) J. Appl. Phys., 82, p. 4153
- Sokal, R.R., Rohlf, F.J., (1981) Biometry, p. 621. , Freeman and Company, New York
- Caldarone, M., Ferrari, L., Righini, M., Selci, S., personal communication
Citas:
---------- APA ----------
Bragas, A.V., Landi, S.M. & Martínez, O.E. (1998) . Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification. Applied Physics Letters, 72(17), 2075-2077.http://dx.doi.org/10.1063/1.121280
---------- CHICAGO ----------
Bragas, A.V., Landi, S.M., Martínez, O.E. "Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification" . Applied Physics Letters 72, no. 17 (1998) : 2075-2077.http://dx.doi.org/10.1063/1.121280
---------- MLA ----------
Bragas, A.V., Landi, S.M., Martínez, O.E. "Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification" . Applied Physics Letters, vol. 72, no. 17, 1998, pp. 2075-2077.http://dx.doi.org/10.1063/1.121280
---------- VANCOUVER ----------
Bragas, A.V., Landi, S.M., Martínez, O.E. Laser field enhancement at the scanning tunneling microscope junction measured by optical rectification. Appl Phys Lett. 1998;72(17):2075-2077.http://dx.doi.org/10.1063/1.121280
