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"A comprehensive study of the influence of the stoichiometry on the physical properties of TiO x films prepared by ion beam deposition" (2010) Marchi, M.C.;Bilmes, S.A.;Ribeiro, C.T.M. (...)Alvarez, F. Journal of Applied Physics. 108(6)
"Beyond the first recurrence in scar phenomena" (2000) Wisniacki, D.A.; Borondo, F.; Vergini, E.; Benito, R.M. Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics. 62(6)